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Characteristics of semiconductor BSE electron microscope detector
Plot, Vítězslav ; Hubálek, Jaromír (referee) ; Boušek, Jaroslav (advisor)
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. The theoretical part describes two types of electron microscopes, the interaction of the primary beam with the sample and individual types of electrons and radiation arising during the interaction. The most used types of electron detectors in scanning electron microscope are summarized. The basic characteristics of the semiconductor backscattered electron detector and their measurement methods are described. The experimental part deals with measuring the characteristics of the detector made by Delong Instruments and comparing it with commercially available detectors. Volt-ampere characteristic and dark current, the dependence of the gain on the accelerating voltage, as well as the time response of the detector were measured.
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Bearing diagnosis of electrical motors
Kratochvíl, Lumír ; Janda, Marcel (referee) ; Vítek, Ondřej (advisor)
This work breaks down the individual phenomena and findings that have as a common denominator the emergence of irreversible processes leading to damage to bearings in electrical machinery and equipment. The introduction describes the basic description and division of bearings with the recommended methods of their basic operation. The following chapters then deal with the individual sources of damage, diagnostics of individual damages, or examine in more detail the accompanying phenomena of bearing damage. In the first practical part of the work, damaged bearings are physically analyzed and their diagnostics is performed on an electron microscope. The second part of the work deals with vibrodiagnostics and the use of appropriate methods to determine the condition of the rolling bearing and then the location of the source of vibration at error frequencies.
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Ray Tracing for Electron Microscope
Suchánek, Jan ; Lysek, Tomáš (referee) ; Čadík, Martin (advisor)
This thesis is pointed on simulation of electron microscope. It uses knowledge from ray-tracing methods and physically based rendering with physics of electron microscopy. The main object of this thesis is to create realistic simulator for electron microscope which can generate satisfying realistic images. This output can be used for another research in range of machine learning or microscope application development. This method should replace long and more expensive way of getting test images from real system for those research activities.
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Conceptual design of a precision manipulator
Stuchlík, Petr ; Pavlík, Jan (referee) ; Vetiška, Jan (advisor)
This diploma thesis deals with the problems of analysis and the subsequent design of a precision manipulator used as a microscope table. The first part od the final thesis deals with the problems associated with the movement of the test sample within the electron microscope. Subsequently, possiblle design variants were proposed, further developing the next steps fot the correctness and functionality of manipulator. The individual force loads of the components were calculated. The result of the work was constructed as a CAD model with subsequent transfer to the assembly drawing.
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Modification of nanomanipulator used in electron microscope
Habarka, Ondrej ; Tkoč,, David (referee) ; Krejsa, Jiří (advisor)
Cílem této diplomové práce je zlepšit chování nanomanipulátoru, používaného v elektronovém mikroskopu, při vykonávaní nejmenších kroků pohybu. První částí je analýza mechanismu za účelem nalezení možných řešení problému. Dále se práce zabývá testováním řešení jako je optimalizace tuhosti předepínacích pružin mechanismu anebo změna mazání šnekového převodu mechanismu. Výsledkem práce je výběr nejvhodnějšího řešení problému na základě výsledků testů a následná modifikace nanomanipulátoru.
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Microscopic analysis of silicon solar cells defects
Brukner, Jakub ; Solčanský, Marek (referee) ; Stojan, Radek (advisor)
This thesis deals with detection of defects solar cells using method electroluminescent, electron microscope and subsequent 3D modeling of areas with defects and structure of the solar cell. In the text are describe basic methods for detection of defects appearing in solar cells. Also some basic defects which can be made during manufacture are there describe. For better orientation the basic principle of functionality and manufacturing process is included.
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Effect of vibration on image quality of the electron microscope
Šafář, Pavel ; Horák, Karel (referee) ; Havránek, Zdeněk (advisor)
My thesis focuses on one the parasitic factors influencing an electron microscope during recording - i.e. the vibrations. Their impact on the quality of the shots is crucial and it is thus desirable to discover the origin of the vibrations and the way they are transmitted on the device and also to strive to eliminate this phenomen as much as possible. Measurements to estimate the source of vibration on the device as well as in its surrounding are a part of my work.
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