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	X-ray scattering study of oxide precipitates in Cz-Si Caha, O. ; Meduňa, M. ; Bernatová, S. ; Růžička, J. ; Mikulík, P. ; Buršík, Jiří ; Svoboda, Milan ; Bernstorff, S. Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry. Detailed record
	Potential for nanotechnology approaches in the production of crystalline and thin film silicon solar cells Poruba, Aleš ; Vaněček, Milan ; Bařinka, R. ; Čech, P. ; Wostrý, P. Increasing the solar cell conversion efficiency together with reducing their production cost are the trends of the last years which are necessary for the near future grid parity of "the energy from the sun". This paper deals mainly with the first part of trends, i.e., with enhanced cell efficiency while keeping the production cost nearly the same or even lower taking into account the potential for the implementation of nanotechnologies in both monocrystalline and thin film silicon devices. Detailed record
	Effect of structure on mechanical properties of covalent ceramics Čtvrtlík, Radim ; Kulykovskyy, Valeriy ; Vorlíček, Vladimír ; Boháč, Petr ; Stranyánek, Martin Mechanical properties of hard amorphous and nanocrystalline films with dominant covalent bonds are nowadays the subject of enhanced interest. Such films can be harder than corresponding bulk material due to peculiarities of structure and numerous growth defects. Detailed record
	Preparation of Cu3(Si0.5Ge0.5) Nanoplatelets Dřínek, Vladislav ; Fajgar, Radek ; Palatinus, Lukáš ; Klementová, Mariana ; Novotný, F. The nanoplatelets possess composition corresponding to Cu3(Si0.5Ge0.5). The 3D collection of electron diffraction patterns has shown that the rooom-temperature structure of the nanoplatelets corresponds to the ?-Cu3Si phase. Evaluation of the diffraction pattern shows that the structure has trigonal symmetry with long period incommensurate modulation. it can be approximately described in a 36-fold superstructure with trigonal unit cell and cell dimensions a=b=16.1A6, c=21.8A6. Detailed record
	Zobrazení dopovaného křemíku na velmi nízkých energiích pomocí rastrovacího elektronového mikroskopu Hovorka, Miloš ; Mikmeková, Šárka ; Frank, Luděk Scanning low energy electron microscope equipped with cathode lens was employed in observation of differently doped areas in silicon imaged at units of eV. The phenomena connected with injected charge, contamination and modulation of electron reflectivity are discussed. Detailed record
	Imaging of doped silicon structures using PEEM and LVSEM Hovorka, Miloš ; Mika, Filip ; Frank, Luděk Study of doped silicon structures using photoemission electron microscopy and low-voltage scanning electron microscopy. Detailed record
	Studium vlastností dopovaného křemíku pomocí fotoemisní elektronové mikroskopie s využitím energiového filtru Hovorka, Miloš ; Frank, Luděk ; Valdaitsev, D. ; Nepijko, S. ; Elmers, H. ; Schönhense, G. 4) PEEM equipped with high-pass energy filter as a surface sensitive tool was used for characterization of electron-optical contrast between differently doped areas in silicon. The native-oxide covered samples of both p- and n-type with dopant concentrations of 1015 to 1019 cm-3 were observed. In full photoemission the contrast disappears when decreasing the dopant concentration, while in filtered images the inverted contrast is preserved for all dopant concentrations. The photothreshold difference between p- and n-type (indicated by the shift of the energy spectra) increases up to 0.2 eV at the highest concentrations. Detailed record
	Nanodifúze 3. Neobvyklá difúze v hrubozrném Si Rothová, Věra A new interpretation of literature data concerning diffusion of gold into coarse-grained silicon is presented. Detailed record
	Study of microcrystalline silicon by combined AFM microscope Mates, Tomáš ; Fejfar, Antonín ; Rezek, Bohuslav ; Fojtík, Petr ; Drbohlav, Ivo ; Luterová, Kateřina ; Pelant, Ivan ; Kočka, Jan Recent results by combined AFM (topography and local conductivity) and correlation between microstructure and electrical properties of thin silicon films. Detailed record
	Diatoms of the genus Synedra and silicon in the water reservoir Drásov (Czech Republic) Bílý, Michal Detailed record

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