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Interferometric coordinates measurement sytem for local probe microscopy nanometrology
Hrabina, Jan ; Lazar, Josef ; Klepetek, P. ; Číp, Ondřej ; Čížek, Martin ; Holá, Miroslava ; Šerý, Mojmír
We present an overview of new approaches to the design of nanometrology measuring system with a focus on methodology of nanometrology interferometric techniques and associated problems. The design and development of a nanopositioning setup with interferometric multiaxis monitoring and control involved for scanning probe microscopy techniques (primarily atomic force microscopy, AFM) for detection of the sample profile is presented. Coordinate position sensing allows upgrading the imaging microscope techniques up to quantified measuring. Especially imaging techniques in the micro- and nanoworld overcoming the barrier of resolution given by the wavelength of visible light are a suitable basis for design of measuring systems with the best resolution possible. The system is being developed in cooperation with the Czech metrology institute and it is intended to operate as a national nanometrology standard combining local probe microscopy techniques and sample position control with traceability to the primary standard of length.
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Classical and advanced methods of optical micromanipulations and their applications
Zemánek, Pavel ; Brzobohatý, Oto ; Šiler, Martin ; Karásek, Vítězslav ; Samek, Ota ; Jákl, Petr ; Šerý, Mojmír ; Ježek, Jan
Optical micro-manipulation techniques have been using for more than 30 years to transfer the momentum from light to microparticles or nanoparticles and influence their movement in liquid, on the surface, or in the air. These days such techniques become more developed and frequently used in physics, chemistry and biology to manipulate, trap, rotate, or sort various types of objects, including living cells in a contactless and gentle way.
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Multiple Probe Photonic Force Microscopy
Jákl, Petr ; Šerý, Mojmír ; Zemánek, Pavel
Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance.
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Interferometer controlled positioning for nanometrology
Lazar, Josef ; Číp, Ondřej ; Čížek, Martin ; Hrabina, Jan ; Šerý, Mojmír ; Klapetek, P.
We present a system for dimensional nanometrology based on scanning probe microscopy techniques (primarily atomic force microscopy, AFM) for detection of sample profile combined with interferometer controlled positioning. The interferometric setup not only improves resolution of the position control but also ensures direct traceability to the primary etalon of length. The system was developed to operate at and in cooperation with the Czech metrology institute for calibration purposes and nanometrology. The interferometers are supplied from a frequency doubled Nd:YAG laser stabilized by linear absorption spectroscopy in molecular iodine and the interferometric configuration controls the stage position in all six degrees of freedom.
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Pokročilé techniky optických mikromanipulací
Zemánek, Pavel ; Čižmár, Tomáš ; Šiler, Martin ; Jákl, Petr ; Šerý, Mojmír ; Karásek, Vítězslav ; Brzobohatý, Oto
Nowadays the classical tool of optical micro-manipulations - optical tweezers - found numerous applications in physics, biology and chemistry. However new techniques were developed that used more sophisticated laser beam tailoring and enable to modify positions and number of manipulated objects dynamically, to sort optically objects according to their properties, to deliver them over millimetre long distances or even to let them self-organize after light illumination. We present several results dealing with the above mentioned advanced techniques developed in our laboratory.
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