Original title: Multiple Probe Photonic Force Microscopy
Authors: Jákl, Petr ; Šerý, Mojmír ; Zemánek, Pavel
Document type: Papers
Conference/Event: NANOCON 2011. International Conference /3./, Brno (CZ), 2011-09-21 / 2011-09-23
Year: 2011
Language: eng
Abstract: Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance.
Keywords: photonic force microscopy; scanning probe microscopy; time-sharing traps; two-photon fluorescence
Project no.: CEZ:AV0Z20650511 (CEP), LC06007 (CEP), ED0017/01/01
Funding provider: GA MŠk, GA MŠk
Host item entry: NANOCON 2011. 3rd International Conference, ISBN 978-80-87294-27-7

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0203061

Permalink: http://www.nusl.cz/ntk/nusl-79577


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Research > Institutes ASCR > Institute of Scientific Instruments
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