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The Tools and Equipment for a Bending of Tubes
Kašpárek, Jan ; Štroner, Marek (referee) ; Peterková, Eva (advisor)
The bachelor thesis is aimed to make a general overview of used tools and equipment for a bending of tubes. On the basis of literary evidence the list of basic methods used in bending tubes was created. By conducting a survey in bending tubes producers manufacturing programs, various principles of bending tubes were described, which are supplemented with picture documentation. To each method there were mentioned some of the OEMs. Accompanying pictures describe the construction of individual machines and used tools and equipment.
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Microdefects in Czochralski Silicon
Válek, Lukáš ; Fejfar, Antonín (referee) ; Mikulík, Petr (referee) ; Spousta, Jiří (advisor)
Disertační práce se zabývá studiem defektů v monokrystalech Czochralskiho křemíku legovaných bórem. Práce studuje vznik kruhových obrazců vrstevných chyb pozorovaných na povrchu křemíkových desek po oxidaci. Hlavním cílem práce je objasnit mechanismy vzniku pozorovaného rozložení vrstevných chyb na studovaných deskách a vyvinout metody pro řízení tohoto jevu. Na základě experimentálních analýz a rozborů obecných mechanismů vzniku defektů jsou objasňovány vazby mezi vznikem defektů různého typu. Tyto jsou pak diskutovány v souvislosti s parametry krystalu i procesu jeho růstu. Takto sestavený model je využit pro vývoj procesu růstu krystalů, kterým je potlačen nadměrný vznik defektů ve studovaných deskách. Za účelem studia defektů jsou zaváděny a vyvíjeny nové analytické metody. Disertační práce byla vytvořena za podpory ON Semiconductor Czech Republic, Rožnov pod Radhoštěm.
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Solder Wave Process Optimization
Procházka, Martin ; Brno, Martin Štěpánek HONEYWELL (referee) ; Starý, Jiří (advisor)
This work describes solder wave process and it‘s optimalization. It informs us about wave soldering and describes it’s fragments. Next it is described partition of fluxes and their properties. In practical part is described researching of defects on PCB’s and analysis of possible reason of defects, measurement of the weight of sprayed flux and measurement of solderable profile.
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Analysis of Defects on PCB Using X-RAY
Mlýnek, Martin ; Vala, Radek (referee) ; Řihák, Pavel (advisor)
This thesis is focused on BGA packages and fault detection after rework using X – Ray. There is a description of BGA packages by carrier substrate, techniques of connecting on chip, from mounting packages to repair printed circuit boards (hereafter PCB). Thesis summarizes description of defects, which are created after rework process. There is also description of X – Ray as method for analyzing defects. X – PLANE method used to detect internal structure of BGA packages and it was confirmed by microsection and by software for reconstruction. Description of automatic and manual measurement is follow.
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The lamination of Low Temperature Co-fired Ceramic
Hudeček, Ondřej ; Klíma, Martin (referee) ; Kosina, Petr (advisor)
Master’s thesis deals with the optimalization of low-temperature cofired ceramic lamination process that affects the final quality of 3D structures (eg., channels, cavities, membranes, etc.). The paper evaluates the influence of lamination parameters (pressure, temperature, time) on the formation of defects in the structure, which were detected by appropriate methods. The last parts describes designed and simulation cooling water system using LTCC technology.
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Synthesis of electromagnetic bandgap structures
Šedý, Michal ; Kovács, Peter (referee) ; Raida, Zbyněk (advisor)
In microwave frequency band, the planar technology is mainly used to fabricate electronic circuits. Propagation of surface waves belongs to the significant problem of this technology. Surface waves can cause unwanted coupling among particular parts of the structure and can degrade its parameters. The problem can be solved using an electromagnetic band gap structure (EBG). These periodic structures are able to suppress surface waves in different frequency bands. This thesis is focused on the modeling of these structures in the program COMSOL Multiphysics.
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Diagnostic of photovoltaic cells by LBIV
Sládek, František ; Jandová, Kristýna (referee) ; Vaněk, Jiří (advisor)
This dissertation main point is to take up with fotovoltanic cells metering methods. Dissertation work dwells with the most common defects rising during the fotovoltanic cells manufacturing. Also, there is a diagnosis workshop proposal and realisation. Workshop uses the Light Beam Inducted Voltages (LBIV) method. By the help of this method, fotovoltanic cells structures are analised and compared to the Light Beam Inducted Current (LBIC).
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