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Communication and control card for electron microscope
Robotka, Jan ; Petyovský, Petr (referee) ; Macho, Tomáš (advisor)
The main aim of this thesis is to design a communication and control card for an electron microscope, eventually for other equipments of the company Delong Instruments a.s., which is dealing with its development and production. This card should replace existing communication card because of its low computational performance. Also, it should replace control and measure card manned with A/D and D/A converters. Thus, the new card will be providing not only the communication with a superior PC and other electronic systems, but also the control of other subsystems of the electron microscope, the determining of processional states and the measuring of internal physical quantities. At the beginning the requirements were determined and the main concept was made with the inclusion of the simple block diagram. It was very important to choose a suitable microcontroller, which will be an intelligence of the whole card and so it will be the most important component. The accent was set mainly on the sufficient computational performance, high modularity of its periphery, good vision of the future innovation and support and, of course, the price. The next requirement was the implementation of the Ethernet, which will be used for the communication between the card and the superior PC. The microcontroller which was chosen have the core architecture ARM Cortex-M3 and it is described in separate chapter. The next part of this thesis is dealing with the main communication standard of the card, which is the Ethernet. After the general description, the Ethernet was mainly discussed in context of the chosen microcontroller. The possibilities of the application of higher layer TCP/IP protocols were also discussed. Implied part of the thesis was the selection of other important components, especially A/D and D/A converters. Its characteristics will have a big effect on the characteristics of the card. In the last and the most important phase the electrical scheme was designed and it was described in detail. This scheme is the main result of this thesis and it is the main document for the future realization. Designed card will be able to process and control 16 differential analogue input signals, 16 differential analogue output signals, 8 digital inputs, 8 simple digital outputs and 4 digital outputs triggered by optocouplers. It will be able to communicate with the superior PC over the Ethernet with the maximum bit rate of 100 Mbit/s, with other electronic cards over the serial line UART through the optical fibers and with other internal and external equipments over the RS-485 and RS-232.
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Modification of nanomanipulator used in electron microscope
Habarka, Ondrej ; Tkoč,, David (referee) ; Krejsa, Jiří (advisor)
Cílem této diplomové práce je zlepšit chování nanomanipulátoru, používaného v elektronovém mikroskopu, při vykonávaní nejmenších kroků pohybu. První částí je analýza mechanismu za účelem nalezení možných řešení problému. Dále se práce zabývá testováním řešení jako je optimalizace tuhosti předepínacích pružin mechanismu anebo změna mazání šnekového převodu mechanismu. Výsledkem práce je výběr nejvhodnějšího řešení problému na základě výsledků testů a následná modifikace nanomanipulátoru.
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Microscopic analysis of silicon solar cells defects
Brukner, Jakub ; Solčanský, Marek (referee) ; Stojan, Radek (advisor)
This thesis deals with detection of defects solar cells using method electroluminescent, electron microscope and subsequent 3D modeling of areas with defects and structure of the solar cell. In the text are describe basic methods for detection of defects appearing in solar cells. Also some basic defects which can be made during manufacture are there describe. For better orientation the basic principle of functionality and manufacturing process is included.
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Bearing diagnosis of electrical motors
Kratochvíl, Lumír ; Janda, Marcel (referee) ; Vítek, Ondřej (advisor)
This work breaks down the individual phenomena and findings that have as a common denominator the emergence of irreversible processes leading to damage to bearings in electrical machinery and equipment. The introduction describes the basic description and division of bearings with the recommended methods of their basic operation. The following chapters then deal with the individual sources of damage, diagnostics of individual damages, or examine in more detail the accompanying phenomena of bearing damage. In the first practical part of the work, damaged bearings are physically analyzed and their diagnostics is performed on an electron microscope. The second part of the work deals with vibrodiagnostics and the use of appropriate methods to determine the condition of the rolling bearing and then the location of the source of vibration at error frequencies.
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Ray Tracing for Electron Microscope
Suchánek, Jan ; Lysek, Tomáš (referee) ; Čadík, Martin (advisor)
This thesis is pointed on simulation of electron microscope. It uses knowledge from ray-tracing methods and physically based rendering with physics of electron microscopy. The main object of this thesis is to create realistic simulator for electron microscope which can generate satisfying realistic images. This output can be used for another research in range of machine learning or microscope application development. This method should replace long and more expensive way of getting test images from real system for those research activities.
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Conceptual design of a precision manipulator
Stuchlík, Petr ; Pavlík, Jan (referee) ; Vetiška, Jan (advisor)
This diploma thesis deals with the problems of analysis and the subsequent design of a precision manipulator used as a microscope table. The first part od the final thesis deals with the problems associated with the movement of the test sample within the electron microscope. Subsequently, possiblle design variants were proposed, further developing the next steps fot the correctness and functionality of manipulator. The individual force loads of the components were calculated. The result of the work was constructed as a CAD model with subsequent transfer to the assembly drawing.
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Using Computer Aided Engineering for analyse the detector
Vyroubal, Petr ; Polsterová, Helena (referee) ; Maxa, Jiří (advisor)
This master's thesis deals with influence of the shape comparison of convergent and Laval nozzles in the secondary electron detector shutters to the resulting pressure and gas flow in the secondary electron detector for environmental scaning electron mictoscope. To the detector analysis are used Computer Aided Engineering systems CAD and CAE, SolidWorks and SolidWorks Flow Simulation.
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