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Analysis of process for production of small plates
Talanda, Jiří ; Fiala, Alois (referee) ; Koška, Petr (advisor)
Theme of the Master’s thesis is analysis of process for production of small plates. Main parts of the thesis are analysis of the production process, process mapping, data capture, analysis of the data by Pareto analysis and find causes of nonconformities. Causes analysis is based on data analysis and process observation. It is divided to chapters by factors which are influencing the process. Optimization measures are designed with regard to their simplicity of realization and system in organization.
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Mobile applications development for remote control of instrumentation
Macek, Michal ; Křivík, Petr (referee) ; Frk, Martin (advisor)
The presented work describes the growing trend of using mobile devices to control laboratory instruments and displaying of measured data. The main objective is the application development for mobile devices, which will allow to remotely control and measure with laboratory instruments. The practical part is focused to programming mobile application which will be able by using the local network to connect multiple laboratory instruments, setting them for different types of measurements and then display measured data.
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Uncertainties of Accurate Length Measurement
Šrámek, Jan ; Brno), Václav Duchoň (ČMI (referee) ; Vdoleček, František (advisor)
This diploma thesis is supposed to inform readers interested in the distance measurements un-certainty on practical issues connected with the solving of these troubles when utilising a frequently used calibration method - the SIP distance meter. This measuring was implemented by the Czech Metrologic Institute, where the author works; therefore he could take advantage of his rich experience as well as experience of his superiors and colleagues. The author regards the national metrological institute (ČMI) as a sufficient guarantee for the hereinafter presented materials, both regarding the professional qualification and from the perspective of formal rightness of this thesis.
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The introduction of metrological procedures for determining the eligibility of gauges in tribology
Rozlílková, Lada ; Harčarík, Matej (referee) ; Šrámek, Jan (advisor)
This bachelor thesis deals with metrological procedures in determining the capability of measuring instruments in production in a company operating in the field of precision engineering. The main goal of each business is its competitiveness in the industry and the satisfaction of customer. Therefore in companies is a great deal of emphasis on modernizing and optimizing the production process, logistics, and reducing the enviromental impact. The customer's demands are constantly increasing and that is why the accuracy of the product is emphasized. So it is not only necessary to produce the product correctly and accurately, but also to check its quality, whether it fits within the given tolerances and meets the customer's requirements.
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Determination Accuracy of Measurement in Nanometrology
Šrámek, Jan ; Číp, Ondřej (referee) ; Tykal, Miroslav (referee) ; Jankových, Róbert (advisor)
The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system. It addresses a newly developed method of exact measurements in nanometrology by touch probes. The aim of this work was to expand the measurement options of this device and design a methodology proposal for the measurement of small parts, including the determination of accuracy of measurement of this device when used in nanometrology. The work includes the new methodology for the calculation of uncertainty of measurement, which constitutes a keystone in determining the accuracy of measurement of a accuracy three coordinate measuring system (hereinafter only nano-CMM). The first part of the doctoral thesis analyzes the present situation in the area of evaluation of accuracy of measurement in very accurate length measurements. It defines and describes individual methods implemented in the determination of accuracy of measurement on the instrument nano-CMM. A great emphasis is placed on the methodology of the measurement uncertainty, which draws from the author’s experience as a metrologist working in the laboratories of the Department of Primary nanometrology and technical length, Czech Metrology Institute Brno (hereinafter only CMI Brno). The second part of the doctoral thesis focuses on the determination of accuracy of length measurement in nanometrology, using a large set of measurements that were carried out under the reproducibility and repeatability conditions. There is also described and tested a model procedure utilizing the Monte Carlo method to simulate the measuring system nano-CMM in order to extent the newly created methodology of the measurement of uncertainty using a touch probe on the instrument nano-CMM. A substantial part of this doctoral thesis provides a detailed evaluation of results obtained from experiments that were executed under the repeatability and reproducibility conditions, especially for the purposes of the determination of the uncertainty of measurement. In this doctoral thesis, the uncertainty of measurement is chosen to quantify the accuracy of measurement of the instrument nano-CMM. The final part of this thesis summarizes the knowledge obtained during the scientific research and provides its evaluation. For the methodology used to determine the accuracy of measurement in nanometrology, it also outlines the future development in the area of scientific research, including the practical use in metrological traceability and extremely accurate measurements for customers. Furthermore, it deals with the possible use of other scanning systems compatible with the instrument nano-CMM.
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Determination Accuracy of Measurement in Nanometrology
Šrámek, Jan ; Číp, Ondřej (referee) ; Tykal, Miroslav (referee) ; Jankových, Róbert (advisor)
The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system. It addresses a newly developed method of exact measurements in nanometrology by touch probes. The aim of this work was to expand the measurement options of this device and design a methodology proposal for the measurement of small parts, including the determination of accuracy of measurement of this device when used in nanometrology. The work includes the new methodology for the calculation of uncertainty of measurement, which constitutes a keystone in determining the accuracy of measurement of a accuracy three coordinate measuring system (hereinafter only nano-CMM). The first part of the doctoral thesis analyzes the present situation in the area of evaluation of accuracy of measurement in very accurate length measurements. It defines and describes individual methods implemented in the determination of accuracy of measurement on the instrument nano-CMM. A great emphasis is placed on the methodology of the measurement uncertainty, which draws from the author’s experience as a metrologist working in the laboratories of the Department of Primary nanometrology and technical length, Czech Metrology Institute Brno (hereinafter only CMI Brno). The second part of the doctoral thesis focuses on the determination of accuracy of length measurement in nanometrology, using a large set of measurements that were carried out under the reproducibility and repeatability conditions. There is also described and tested a model procedure utilizing the Monte Carlo method to simulate the measuring system nano-CMM in order to extent the newly created methodology of the measurement of uncertainty using a touch probe on the instrument nano-CMM. A substantial part of this doctoral thesis provides a detailed evaluation of results obtained from experiments that were executed under the repeatability and reproducibility conditions, especially for the purposes of the determination of the uncertainty of measurement. In this doctoral thesis, the uncertainty of measurement is chosen to quantify the accuracy of measurement of the instrument nano-CMM. The final part of this thesis summarizes the knowledge obtained during the scientific research and provides its evaluation. For the methodology used to determine the accuracy of measurement in nanometrology, it also outlines the future development in the area of scientific research, including the practical use in metrological traceability and extremely accurate measurements for customers. Furthermore, it deals with the possible use of other scanning systems compatible with the instrument nano-CMM.
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The introduction of metrological procedures for determining the eligibility of gauges in tribology
Rozlílková, Lada ; Harčarík, Matej (referee) ; Šrámek, Jan (advisor)
This bachelor thesis deals with metrological procedures in determining the capability of measuring instruments in production in a company operating in the field of precision engineering. The main goal of each business is its competitiveness in the industry and the satisfaction of customer. Therefore in companies is a great deal of emphasis on modernizing and optimizing the production process, logistics, and reducing the enviromental impact. The customer's demands are constantly increasing and that is why the accuracy of the product is emphasized. So it is not only necessary to produce the product correctly and accurately, but also to check its quality, whether it fits within the given tolerances and meets the customer's requirements.
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