National Repository of Grey Literature 164 records found  beginprevious153 - 162next  jump to record: Search took 0.01 seconds. 
What is the buzz about the TZ mode
Kolařík, Vladimír ; Matějka, František ; Matějka, Milan ; Horáček, Miroslav ; Urbánek, Michal ; Bok, Jan ; Krátký, Stanislav ; Král, Stanislav ; Mika, Filip
This contribution deals with an e-beam pattern generator BS 600 that works with a variable rectangular spot of electrons (stamp). The TZ stands for the ‘technology zoom’; its meaning is a reduction of the spot size by a factor of 3. Original description of the TZ exposure mode can be found in (1), [2] and [3]; further aspects concerning the exposure system and its electron source were described in [4] and [5]; technology and related topics are discussed in [6], [7], [8] and [9]; overview of application areas is in [10], [11] and [12]; and finally, very recent results are summarized in [13], [14] and [15].
Situation of local fees and property tax in municipal budgets of the Czech Republic
Urbánek, Martin ; Peková, Jitka (advisor) ; Pucandlová, Miroslava (referee)
The main contribution of this thesis is an evaluation of the situation of particular local fees and property tax in municipal budgets of the Czech Republic. First, the thesis deals with evaluation of tax autonomy of Czech municipalities within international comparison and then it focuses on question how much municipalities use their tax competence. Therefore, municipalities are divided into size categories such as 0 -- 500, 501 -- 2 000, 2001 -- 5 000, 5001 -- 10 000, 10 001 -- 20 000 and 20 001 -- 50 000 inhabitants. One of the conclusion of my thesis is finding the high measure of aversion of particular municipalities with respect to the local taxation. Thus, municipalities are not willing to increase their responsibility for tax revenue not from the perspective of economic reason but primarily because of political reason. Elected representatives of municipalities have the feeling that the expansion of their tax competence is in conflict with the aim of their re-election. Therefore, these elected representatives insist on the central level responsibility for taxation and administrative security of tax administration. This attitude might be observed across all observed size categories of municipalities. The methodology for this thesis is going to be a questionnaire survey when for this purpose mayors of randomly selected municipalities have been joined, then the analysis of selected tax revenues and the following comparison of data among particular size categories of municipalities.
Scanning Probe Microscopy: Measuring on Hard Surfaces
Matějka, Milan ; Urbánek, Michal ; Kolařík, Vladimír
During a measurement by scanning probe microscopy (SPM) an image artifacts can appear in a measurement data. The source of image artifacts during an SPM measurement could be in parts of the SPM tool: mechanical system, piezoelectric crystal, scanner electronic. However, the main source of image artifact is the probe tip geometry and properties of the sample. For example, probe wearing, which occurs during the contact measurement on a sample with a hard surface, could result in heavy probe shape change, causing probe-related image artifacts. Measurement could appear problematic on a sample with periodical relief structure (e.g. gratings with sub 10 μm periodicity) prepared in hard materials (e.g. silicon), when the structure height is greater than about 500 nm. In this case, probe can easily get struck during the scanning, on the hard surface as well as at the high aspect ratio relief structure, causing image artifact thus reducing measurement quality.
SPM Nanoscratching in the Sub 100 nm Resolution
Urbánek, Michal ; Kolařík, Vladimír ; Matějka, Milan
Scanning probe microscopy (SPM) is tool basically used for surface characterization. Besides that, it offers several lithographic methods (e.g. nanoscratching) to prepare structures in the sub 100 nm resolution. The nanoscratching using SPM offers a method for patterning of surface with a very high resolution based on near field interaction. By this method some tiny marks or taggants could be prepared. Therefore we used the SPM nanoscratching for preparation of nanostructures in thin soft polymer films by various tips. Nanoscratching regime of SPM is possible to operate in contact and close contact modes. In the contact mode we prepared an array of stamps with a variable size, where dimensions and depth dependency on number of pixels were inspected. For writing of these structures we used polymer films with different softness (e.g. PMMA, SU-8) and various values of setpoint, which are responsible for structures deepness.
THE LIFE AND WORKS OF GIUSEPPE VERDI FOCUSSING ON THE OPERA DON CARLOS
Urbánek, Miroslav ; Podskalský, Miloslav (advisor) ; Podskalský, Miloslav (advisor) ; Tuček, René (referee)
Giuseppe Verdi is amongst one of the greatest opera composers of the nineteenth century. Despite his life's tragic fates he was full of energy which transpired into his operas. His work stems from a strong Italian operatic tradition and culminated to became the peak of Itatian of the ninteenth century. His beginnings were still in an tradition we he left to create a new. He began to write through composed, large scale works with dramatic content to match. Thw works of Berlioz and Wagner had a large influence onVerdi but even as such he did not allow his music to be taken over stylisticly but rather held to his own.The greates treaures in Verdi's music are the beautiful melodic lines of witch he was a master the ever creative rhythmic motives. He uses speaks to the listner through its simple and clear nature. Verdi lifted Itatian opera to a new and higher level. He intentionally chose materials and subject matter that were close to his individual creative person and didn't entertain subjects which were not. Dispite his inovativness he strongly believed that to the leave the Italian operatic tradition was amongst one of the greatest dangers. His operas today belong amongst some of the most played of operas ever written.
Exportní strategie firmy Emco spol. s r. o.
Urbánek, Michal ; Halík, Jaroslav (advisor)
Diplomová práce pojednává nejdříve obecně o problematice exportu. Představuji možné druhy pronikání na zahraniční trhy i rizika s tím spojená. V druhé části se již konkrétně věnuji exportním aktivitám společnosti Emco spol. s r. o.. V úvodu přibližuji exportní sortiment Emca, pozici na zahraničních trzích, a poté charakterizuji jednotlivé mezinárodní marketingové aktivity Emca. Postupně představím cenovou, výrobkovou, distribuční a komunikační politiku společnosti vůči zahraničním partnerům.
Determination of proximity effect forward scattering range parameter in e-beam lithography
Urbánek, Michal ; Kolařík, Vladimír ; Král, Stanislav ; Dvořáková, Marie
Electron beam lithography (EBL) is a tool for generation patterns with high resolution, so it is necesessary to control critical dimensions of created patterns, because the undesired influence of adjacent regions to those exposed can occur due to the proximity effect. Proximity effect is often described by two Gaussian function, where .alpha. represents forward scattering range parameter. Consequently, we present evaluation of proximity parameter .alpha. by various method in this paper.

National Repository of Grey Literature : 164 records found   beginprevious153 - 162next  jump to record:
See also: similar author names
4 URBÁNEK, Marek
8 URBÁNEK, Martin
3 URBÁNEK, Milan
4 Urbanek, Miroslav
4 Urbánek, Marek
8 Urbánek, Martin
2 Urbánek, Matouš
3 Urbánek, Matyáš
22 Urbánek, Michal
4 Urbánek, Miroslav
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