Original title: Analysis of Electron Beam Degraded poly[methyl(phenyl)silylene]
Translated title: Analýza poly[methyl(phenyl)silylene] degradovaného elektronovým svazkem
Authors: Horák, Petr ; Schauer, Petr
Document type: Papers
Conference/Event: Multinational Congress on Microscopy /8./, Prague (CZ), 2007-06-17 / 2007-06-21
Year: 2007
Language: eng
Abstract: [eng] [cze]
Polysilanes (PSi) are a broad class of organic materials whose basic building block is a chain built up of silicon. The susceptibility to material degradation is a characteristic property of PSi. PSi are degradable for example by ultraviolet radiation or by electron beam. The degradation of the material decreases intensity of luminescence. Poly[methyl(phenyl)silylene] (PMPSi) was selected as a typical representative of PSi. Polysilany (Psi) patří mezi širokou skupinu organických materiálů jejichž základním stavebním blokem je řetězec sestavený z křemíku. Náchylnost k degradaci je charakteristická vlastnost PSi. PSi jsou degradovatelné například ultrafialovým zářením nebo elektronovým svazkem. Degradace materiálu snižuje intensitu luminiscence. Poly[methyl(phenyl)silylene] (PMPSi) byl vybrán jako typický reprezentant PSi.
Keywords: cathodoluminescence; electron beam degradation; poly[methyl(phenyl)silylene]; polysilanes; PSi
Project no.: CEZ:AV0Z20650511 (CEP), IAA100100622 (CEP)
Funding provider: GA AV ČR
Host item entry: Proceedings of the 8th Multinational Congress on Microscopy, ISBN 978-80-239-9397-4

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0152870

Permalink: http://www.nusl.cz/ntk/nusl-37988


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Research > Institutes ASCR > Institute of Scientific Instruments
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