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Scintillation Detector of Secondary Electrons for ESEM
Čudek, Pavel ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for environmental scanning electron microscopy. It describes dilemma of environmental scanning electron microscopy, types of detectors and secondary electrons detection. The experimental part of this thesis focuses on the design and construction of new scintillation detector on the basis of simulations secondary electrons trajectories. Identifying the parameters, pressure dependencies and optimizations of electrode system of the detector realized.
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Scintillation SE detector fo environmental scanning electron microscope
Odehnal, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains theory about scanning electron microscopy. It describes construction, principle of operation and sinals generated by interactions between primary electron beam and specimen. Furthermore, it describes the most common method for detection of secondary electrons using scintillation detector. Next chapters are dealing with last development stage of scanning electron microscopy, which is environmental scanning electron microscopy. Experimental part is evaluating dependency of size of detected signal with scintillation detector on pressure of water vapor in specimen chamber. It also considers appropriate size of voltages enclosed on electrodes of the scintillation detector to optimize detection.
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Scintillation SE Detector for VP SEM
Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
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Ionization Detector for Variable Pressure SEM
Černoch, David ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This graduation theises deal with influence of an additional grating possitioned berween the sample and the ionisation detektor of the environmental scannin elektron microscope on signal detection. Signal level is measured for changing pressure, at different voltages on the aditional grating, at different sample - additional electrode distance and at different sample - detektor distance. Influence of the additional grating is simulated for real working conditions on PC.
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Scintillation SE detector fo environmental scanning electron microscope
Odehnal, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains theory about scanning electron microscopy. It describes construction, principle of operation and sinals generated by interactions between primary electron beam and specimen. Furthermore, it describes the most common method for detection of secondary electrons using scintillation detector. Next chapters are dealing with last development stage of scanning electron microscopy, which is environmental scanning electron microscopy. Experimental part is evaluating dependency of size of detected signal with scintillation detector on pressure of water vapor in specimen chamber. It also considers appropriate size of voltages enclosed on electrodes of the scintillation detector to optimize detection.
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Scintillation SE Detector for VP SEM
Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
|
|
|
Ionization Detector for Variable Pressure SEM
Černoch, David ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This graduation theises deal with influence of an additional grating possitioned berween the sample and the ionisation detektor of the environmental scannin elektron microscope on signal detection. Signal level is measured for changing pressure, at different voltages on the aditional grating, at different sample - additional electrode distance and at different sample - detektor distance. Influence of the additional grating is simulated for real working conditions on PC.
|
|
|
Scintillation Detector of Secondary Electrons for ESEM
Čudek, Pavel ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for environmental scanning electron microscopy. It describes dilemma of environmental scanning electron microscopy, types of detectors and secondary electrons detection. The experimental part of this thesis focuses on the design and construction of new scintillation detector on the basis of simulations secondary electrons trajectories. Identifying the parameters, pressure dependencies and optimizations of electrode system of the detector realized.
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