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Free-space optical link fro coherent transfer
Hrabina, Jan ; Čížek, Martin ; Barcík, P. ; Kolka, Z. ; Skryja, P. ; Wilfert, O.
The dissemination of precise optical frequencies and time has an irreplaceable role in many applications (scientific experiments in time and frequency metrology, security of critical infrastructures, synchronisation of navigation systems, sensors). We must deploy a different transmission type where optical fibre links cannot be used. The paper describes the possible distribution of stable optical frequencies by the free-space optical link between FEEC BUT Brno (responsible for development and operation of FSO units) and ISI CAS CR (responsible for optical laser source, optical fibre links, data processing).
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New methods of sample preparation for modern scanning electron microscopy
Ambrož, Ondřej ; Čermák, Jan ; Mikmeková, Šárka
Modern scanning electron microscopes (SEM) are equipped with a very sophisticated detection system that allows the detection of signal electrons by several differently located detectors simultaneously. Signal electrons are filtered according to energy and angle. Effective signal filtering in SEM together with the possibility of using very low impact energies of the primary beam leads to the extreme sensitivity of this method to the quality of the sample surface. Current metallographic methods of sample preparation are becoming insufficient for advanced imaging in modern SEM instruments. Classical sample preparation proves to be completely unsuitable especially for low-voltage scanning electron microscopy. The work will present the first results of the influence of preparation methods on the surface condition and the possibility of differentiating the individual phases of TRIP steel using advanced electron microscopy techniques. The possibilities of new procedures using robotics will be shown.
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Artifacts and errors in EBSD mapping of retained austenite in TRIP steel
Mikmeková, Šárka ; Jozefovič, Patrik ; Ambrož, Ondřej
The present work aims to demonstrate artifacts and errors in visualization of retained austenite phase in TRIP steel by an electron back-scattered diffraction (EBSD) technique. Retained austenite phases size and shape obtained by the EBSD are directly compared with a real image of these phases acquired by means of an atomic force microscopy (AFM). The effect of the step size parameter used for the EBSD analysis on the retained austenite phase fraction and morphology is discussed in detail and quantified. Surface roughness as a barrier for the imaging of fine features situated on a specimen surface is demonstrated.
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Apparatus for automatic chemical etching of metallographic samples
Ambrož, Ondřej ; Čermák, Jan ; Mikmeková, Šárka
The microstructure of steels after mechanical polishing is revealed only by the application of a suitable etchant. To achieve adequate optical or electron microscope images, the specimen surface must be free of any artifacts. Chemical etching can be defined as a controlled corrosion process. The metal of the investigated material passes as cations into the etchant solution during the chemical etching reaction. Chemical etching is usually performed manually either by immersing the sample in the etchant with simultaneous stirring or by swabbing with a lint-free cloth soaked in the etchant. It is also extremely important to debug the process of removing the sample from the bath and subsequent cleaning. It is recommended to wash the sample after removal from the etchant with water (distilled or demineralized) or alcohol (ethanol, methanol, or isopropyl alcohol) and dry it properly (depending on the etchant and the etched material). The main problem with these processes is the human factor, which significantly contributes to the already limited repeatability. All operation steps must be performed by properly trained personnel in the field of occupational safety because hazardous substances are handled. A high manual dexterity is also needed. Training a new employee is a long-term process. Moreover, keeping the exact etching time can be a challenge and one second can decide success. These problems become more serious in the case of using surface sensitive analytical method, such as a low energy scanning electron microscopy, due to the high spatial resolution and extreme surface sensitivity. We have developed an apparatus for automatic etching of metallographic samples of purpose to overcome all above-mentioned difficulties. The apparatus and results of the first experiments will be presented.
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Patterning of conductive nano-layers on garnet
Chlumská, Jana ; Lalinský, Ondřej ; Matějka, Milan ; Krátký, Stanislav ; Kolařík, Vladimír
Synthetic crystalline materials of the garnet group are used as scintillators in scanning electron microscopy. If a thick conductive layer is applied on the garnet surface, slower electrons don't have enough energy to pass through this relatively thick conductive layer on the scintillator surface. Therefore, either thinner conductive layer or appropriate patterning of the thicker layer has to be used. Within this contribution we study the patterning process of such conductive nano-layer. Resolution of the patterning process is of high interest. Two approaches are compared: direct writing electron beam lithography and mask projection UV lithography.
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Study of secondary phases in trip steel by advanced sem and afm techniques
Mikmeková, Šárka ; Ambrož, Ondřej ; Hegrová, J. ; Aoyama, T.
The paper aims to demonstrate a modern scanning electron microscope (SEM) as a powerful tool for visualization of the secondary phases in TRIP steel. The TRIP steel specimens prepared by various metallographic techniques were imaged by the SEM and the secondary phases presence was confirmed by an electron back-scattered diffraction (EBSD) technique. The chemical polishing by 5 % HF in H2O2 for 10 seconds results in selective etching for each individual phase, as confirmed by an atomic force microscopy (AFM) and hybrid AFM-in-SEM techniques. The phases are easily distinguishable in the SEM micrographs created by the low energy high take-off angle signal electrons. The proposed sample preparation technique together with special SEM imaging conditions enables us accurate analysis of distribution of secondary phases within the TRIP steel matrix and moreover, the retained austenite is distinguishable from the martensite phase.
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Trip steel specimen preparation for advanced sem and EBSD
Ambrož, Ondřej ; Mikmeková, Šárka ; Hegrová, J. ; Aoyama, T.
Modern scanning electron microscopy (SEM) allows observations of specimens with high surface sensitivity. The surface sensitivity is significantly affected by the accelerating voltages. With the development of the scanning electron microscopy, the requirements for the surface quality of samples increase. Metallographic methods originally intended for light microscopy become insufficient. The problem occurs especially with multiphase materials having a fine-grained structure. The investigated TRIP steel consists of a ferritic-bainitic matrix, retained austenite and martensite phases. The sizes of the smallest phases are nanometer units. The volume of residual austenite was determined by X-ray diffraction. The basic preparation of all tested samples involved conventional metallographic grinding and very fine mechanical polishing. One sample was analysed in this state. Other samples were subsequently chemically polished, electropolished and chemical-mechanically polished. The specimens were observed in the SEM using a SE and a BSE detector at low energies immediately after the preparation. An EBSD was performed in the same areas to characterize the retained austenite. Topographical imaging by special AFM, integrated into the SEM, demonstrated that the mechanical polishing results in surface deformation and residual austenite is transformed. All other methods have their specifics and for modern sensitive SEM instruments it is necessary to optimize individual procedures.
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Advanced methods of TRIP steel sample preparation and imaging using modern scanning electron microscope techniques
Ambrož, Ondřej ; Mikmeková, Šárka
Multiphase steels, including TRIP steels, excel in their mechanical properties and find application in many sectors, such as the automotive industry. Studying the microstructure of such materials is very difficult, especially with regard to the differentiation of phases. Current TRIP steels are failing in conventional characterization techniques and there is a demand for the development of new techniques that will enable precise characterization of phases on a nanoscale. The aim of this paper is to use benefit of modern scanning electron microscopy to characterize of individual phases in selected TRIP steel.
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