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PDS 2004 - Proceedings of the works of the PhD students of the Electron optics department
Müllerová, Ilona
The electron microscopy and optics have long term tradition in Brno and now the development and production of microscopes in Brno rapidly increases. So, strong need arises for education of a new generation of specialists. Experience had shown that there have to be a high proportion of workers with scientific education and scientific approach to solve the problems in the electron microscope industry. These are the reasons, why the Electron optics department of the Institute of Scientific Instruments educates students of postgraduate study in a number nearly equal to a number of scientific workers. In 2002 the board of the Electron optics department decided to organize annually the Seminar of postgraduate students, where the works of PhD students in all stages of their study will be orally presented. Moreover, it decided to publish these works in a special volume in the form of extended abstracts of two- to four-pages. Now, third volume of this proceeding, PDS 2004, has been published.
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Local density of states mapping using the reflection of very slow electrons
Pokorná, Zuzana
The aim of the work is performing a series of experiments in an ultra high vacuum electron microscope, demonstrating the inverse proportionality between the reflectance of very slow electrons and the local density of electron states bound to the incident wave. The work also aims to describe quantitatively the imaging of a doped region in the semiconductor surface layer.
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Determination of exact charged-particle trajectories and aberrations of systems in particle optics
Oral, Martin
The paper describes a method of calculation of aberration coefficients by regression (fitting). A prerequisite for the calculation is knowledge of an analytical expression of optical aberrations, which is used not only for fitting, but also for a fast computation of particle positions behind an optical system, e. g. for evaluation of a beam profile. The method is illustrated on computation of current density profiles in a deflected ion beam.
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Study of the contrast mechanisms nonconductive and wet samples in ESEM
Linhart, Jan
This paper deals with the study of the contrast mechanisms of the nonconductive and wet samples in environmental scanning electron microscopy (ESEM). The aim of this work is interpretation of contrast mechanisms dependent on conditions of the primary electron beam and methods of signal electrons detection and determination of the optimal detection method.
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