Národní úložiště šedé literatury Nalezeno 14 záznamů.  předchozí11 - 14  přejít na záznam: Hledání trvalo 0.00 vteřin. 
Optimization of nanocomposite n-TiC/a-C:H coatings preparation and TEM study of coatings structure after deformation
Zábranský, L. ; Buršíková, V. ; Buršík, Jiří ; Vašina, P. ; Souček, P. ; Caha, O. ; Jílek, M. ; Peřina, V.
This work is aimed on the optimization of preparation of nanocomposite n-TiC/a-C:H coatings. Furthermore the deformation of inner structure was studied using TEM analysis of lamella prepared on dual-beam microscope using focused ion beam.
Oxygen Precipitation in CZ Si Wafers after High Temperature
Meduňa, M. ; Caha, O. ; Kuběna, J. ; Kuběna, A. ; Svoboda, Milan ; Buršík, Jiří
In this work we study two stage and three stage annealing processes with application of Tabula rasa. The evolution of precipitates at various phases during annealing process for various temperatures was obtained from series of experimental techniques.
X-ray scattering study of oxide precipitates in Cz-Si
Caha, O. ; Meduňa, M. ; Bernatová, S. ; Růžička, J. ; Mikulík, P. ; Buršík, Jiří ; Svoboda, Milan ; Bernstorff, S.
Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry.
Study of intrinsic stress in CNx films prepared by magnetron sputtering device using electron microscopy
Mikmeková, Eliška ; Sobota, Jaroslav ; Caha, O. ; Mikmeková, Šárka
Preparation and analysis of amorphous carbon nitride thin films (CNx) deposited by RF magnetron sputtering device on silicon wafers (100) is reported.

Národní úložiště šedé literatury : Nalezeno 14 záznamů.   předchozí11 - 14  přejít na záznam:
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4 Caha, Ondřej
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