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Reconstruction of the Janeček mill
Owczarzy, Denis ; Venkrbec, Václav (referee) ; Utíkalová, Ivana (advisor)
The task of this diploma thesis was the development of construction documents for the implementation of project, icluding project specialization. This is a rebuilding of the existing mill and it´s conversion to the object. Proposed reconstruction is solved with a sense of highlighting the exist building and expressing his dominance and function in an environment, where the building is located. From the original state was preserved only main building in historical style, and in contrast to this building were proposed two smaller objects with the background. The object is used as a pension for the accommodation for persons, restaurant and also provides rooms for seminars and meetings. Due to a brooklet flowing in front of the building and location of pension between the spa´s and city parks is the use of this building more than suitable.
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Program for monitor testing
Matyáš, Pavel ; Prokeš, Aleš (referee) ; Michálek, Václav (advisor)
The goal of this term project are problems of LCD panels. The beginning of the term project is about theoretical description of particular types and features of actual LCD panels, origin of picture defects on computer monitors, measuring and picture quality testing methods of monitors. Practical part of project involves designing testing patterns and it's realisation in Borland Delphi development environment.
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Compensation of geometric distortion of electrophoretic gel image
Dvořáček, Tomáš ; Vítek, Martin (referee) ; Škutková, Helena (advisor)
This master thesis is engaged in problematics of creation and compensation of geometric distortions in 1D agarose electrophoresis. This master thesis analyze the problematics of cause of these distortions and summarize the theory needed for compensation of these distortions. Based on acquired theory and created electrophoretic phantoms, the master thesis contains several suggestions for compensation of incurred distortions. These suggestions are recreated into functions, which are connected into a functional user interface for gel image analysis and geometric distortions compensation.
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Optimization of tomographic station GE phoenix adjustment for plastic components including metal parts
Starý, Přemysl ; Petrilak, Michal (referee) ; Zikmund, Tomáš (advisor)
X-ray computed tomography is a tool mostly used in a medical diagnosis. A development of the technique and an improvement an in accuracy of tomographic systems enabled an utilization of the tomography in industrial applications. The tomography allows non-destructive analysis of inner structure. There is a negative influence of a reconstructed area if a low-absorption and high-absorption materials are scanned together. This influence makes analysis of the inner structure impossible. There are two options to eliminate these artifacts. We can use algorithms to reduce metal artifacts, or we can try to avoid them when performing the scan. This bachelor thesis focuses on an optimization of tomographic station adjustment for the plastic components including metal parts. The effect of an usage of X-ray filter or collimator and effect of a sample orientation on data quality will be observed. We use tools like contrast, noise and edge sharpness to evaluate data quality.
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Monitoring the effects of new exposure parameters after transition to CR digital image processing in the Radiodiagnostic Department at Sušice Hospital, o.p.s.
KLIMENT, Karel
At the current time, doses of radiation caused by medical exposure make up the largest part of peoples' exposure to artificial sources of ionising radiation (SIR). Every medical exposure must be justified as of benefit to the individual subject to it. Radiation protection at the workplace is subject to the principle of optimisation. One of the paths leading to optimisation of radiation protection is the specification of the Local Diagnostic Reference Level (LDRL). The objective of this thesis was to test and evaluate whether and how transition to indirect digitisation affects image quality. According to model examinations on a water phantom, the lowest possible dose for which image quality would be preserved was to be determined. If the dose could be reduced, it would be possible to specify a new LDRL. The dose can be reduced, amongst other things, by making appropriate adjustment to exposure parameters on the control unit. I tested how changes in the exposure parameters set affected the quality of the resulting image. I used the water phantom for each examination which corresponded to the thickness of the area to be examined for a standard patient. For constant default voltage, first of all changes to the settings were made to reduced blackening and increase electrical charge. Subsequently, voltage was increased and reduced with a constant blackening level. Image quality was evaluated according to the measured values for noise, and high and low contrast resolution. I used the results to determine recommendations for specific examinations in terms of exposure parameters to be set. I worked out the LDRL for the new exposure parameter settings and compared it to the current LDRL values at the workplace and with the NDRL (National Diagnostic Reference Level).
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Study of contrast mechanisms in environmental scanning electron microscopy
Wandrol, Petr
The main goal of the work is study of contrast materials in environmental scanning electron microscopy. I will concentrate to the design and construction of the original detector of secondary electrons, which is not influenced by backscattered electrons as well as to scintillation detector of backscattered electrons on the basis of single-crystal YAP in the dissertation work. For successful solution of the topic it will be necessary to manage the theory of the influence of magnetic fields on trajectories of electrons. The knowledge of the software SIMION, version 7.0 will be necessary too, together with studying of the theory for assessment of suitable vacuum conditions in differential chambers.
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Imaging of the voltage contrast in environmental SEM
Romanovský, Vladimír ; Autrata, Rudolf
Current methodology of imaging in the scanning electron microscopy is based on the detection of signal electrons that carry topografic and materialcontrast of specimens under study. Electronic devices can be observed because in their standard working mode voltage differences on component surfaces are visualized by means of the voltage contrast. This contrast can be acquired in nearly any commercially available scanning electron microscopeby detection and subsequent analysis of secondary electrons.
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