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Modification of nanomanipulator used in electron microscope
Habarka, Ondrej ; Tkoč,, David (referee) ; Krejsa, Jiří (advisor)
Cílem této diplomové práce je zlepšit chování nanomanipulátoru, používaného v elektronovém mikroskopu, při vykonávaní nejmenších kroků pohybu. První částí je analýza mechanismu za účelem nalezení možných řešení problému. Dále se práce zabývá testováním řešení jako je optimalizace tuhosti předepínacích pružin mechanismu anebo změna mazání šnekového převodu mechanismu. Výsledkem práce je výběr nejvhodnějšího řešení problému na základě výsledků testů a následná modifikace nanomanipulátoru.
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Microscopic analysis of silicon solar cells defects
Brukner, Jakub ; Solčanský, Marek (referee) ; Stojan, Radek (advisor)
This thesis deals with detection of defects solar cells using method electroluminescent, electron microscope and subsequent 3D modeling of areas with defects and structure of the solar cell. In the text are describe basic methods for detection of defects appearing in solar cells. Also some basic defects which can be made during manufacture are there describe. For better orientation the basic principle of functionality and manufacturing process is included.
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Segmentation of microscopic brain structures
Láska, Samuel ; Uher, Václav (referee) ; Burget, Radim (advisor)
This thesis is involved in image processing of medical data and its implementation using Java programming language. The main contribution of this thesis is creation of algorithms for feature extraction from 3D data and subsequent verification of the results for the issue of imagining 3D brain data, and creation of image filters and their implementation in the program RapidMiner. Consequently, the segmentation process is created at the 2D and 3D level, and output of 3D level segmentation are segmented brain structures. Furthermore, segmentation algorithms were compared on the basis of the final form of segmented structures and this approach was compared with other works.
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Bearing diagnosis of electrical motors
Kratochvíl, Lumír ; Janda, Marcel (referee) ; Vítek, Ondřej (advisor)
This work breaks down the individual phenomena and findings that have as a common denominator the emergence of irreversible processes leading to damage to bearings in electrical machinery and equipment. The introduction describes the basic description and division of bearings with the recommended methods of their basic operation. The following chapters then deal with the individual sources of damage, diagnostics of individual damages, or examine in more detail the accompanying phenomena of bearing damage. In the first practical part of the work, damaged bearings are physically analyzed and their diagnostics is performed on an electron microscope. The second part of the work deals with vibrodiagnostics and the use of appropriate methods to determine the condition of the rolling bearing and then the location of the source of vibration at error frequencies.
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Ray Tracing for Electron Microscope
Suchánek, Jan ; Lysek, Tomáš (referee) ; Čadík, Martin (advisor)
This thesis is pointed on simulation of electron microscope. It uses knowledge from ray-tracing methods and physically based rendering with physics of electron microscopy. The main object of this thesis is to create realistic simulator for electron microscope which can generate satisfying realistic images. This output can be used for another research in range of machine learning or microscope application development. This method should replace long and more expensive way of getting test images from real system for those research activities.
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Conceptual design of a precision manipulator
Stuchlík, Petr ; Pavlík, Jan (referee) ; Vetiška, Jan (advisor)
This diploma thesis deals with the problems of analysis and the subsequent design of a precision manipulator used as a microscope table. The first part od the final thesis deals with the problems associated with the movement of the test sample within the electron microscope. Subsequently, possiblle design variants were proposed, further developing the next steps fot the correctness and functionality of manipulator. The individual force loads of the components were calculated. The result of the work was constructed as a CAD model with subsequent transfer to the assembly drawing.
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Contrast in image acquired by ionization detector in VP SEM
Goroš, Pavel ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work deal with problems of investigation materials electron beam. This project is focuses on investigation materials by the help of method environmental scan electron microscopy (ESEM) and describes her patterns. The perfection of ESEM excel above all at studies non - conducting or water containing, often biological samples. These samples not to be in no way prepared or cut – and – dries, in contradistinction to classical scanning electron microscope and thanks is under investigation their native surface structure without desiccation breaking. The general aim is determination of contrast in image acquired by ionization detector.
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Analysis of the supersonic flow of gas in the differentially pumped chamber EREM
Matloch, Roman ; Vyroubal, Petr (referee) ; Maxa, Jiří (advisor)
This work describes briefly electron microscopy issue and physical model of fluid flow. Then presented diploma thesis will be describing analysis and evaluation of the impact of supersonic flow on the pressure and density in the path of the primary electron beam in the differential pumping chamber. For analysis, evaluation and examination of the issue will be used CAD and CAE (Computer Aided Engineering) programs. At the same time it will be developed a methodology of calculation applicable to supersonic flow in the low pressure system at ANSYS CFX.
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Generation and applications of pulsed beam in an electron microscope
Nekula, Zdeněk ; Kozák,, Martin (referee) ; Kolíbal, Miroslav (advisor)
Elektronové mikroskopy jsou celosvětově využívány jak v průmyslu, tak i v základním výzkumu. Tato diplomová práce popisuje, jak použít malé elektrostatické deflektory pro vysoké časové rozlišení v prozařovacích (TEM) i skenovacích (SEM) elektronových mikroskopech. Zde popsaná metoda pro transmisní mikroskopy je nové řešení využívající efekt "streak" kamery. Tento přístup vyniká svojí jednoduchostí, sub-pikosekundovým časovým rozlišením a flexiblilním časovým rozsahem. Dále ve skenovacích mikroskopech je využit malý elektrostatický deflektor pro tvorbu pulzního elektronového svazku. Tento pulzní svazek se používá pro časové rozlišení pomocí stroboskopického efektu. Pro skenovací mikroskopy tato diplomová práce ukazuje dvě nové metody jak měřit délku elektronových pulzů a taky dvě aplikace časově rozlišené detekce. Jsou to časově rozlišený potenciálový krontrast a časově rozlišené elektrické pole.
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