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Original title:
Correlative probe electron microscopy analysis of plasma-treated gallium-doped zinc oxide nanorods
Authors: Rutherford, D. ; Remeš, Zdeněk ; Mičová, J. ; Ukraintsev, E. ; Rezek, B.
Document type: Papers
Conference/Event: NANOCON 2023 - International Conference on Nanomaterials - Research & Application /15./, Brno (CZ), 20231018
Year: 2024
Language: eng
Abstract: Correlative Probe Electron Microscopy (CPEM) was used to investigate the topographical and electronic emission properties of gallium-doped zinc oxide nanorods (ZnO:Ga) after low pressure hydrogen or oxygen plasma treatment. Simultaneous secondary electron (SE) and back-scattered electron (BSE) emission information from the same nanorods enabled true correlation with the topographical information obtained by atomic force microscopy (AFM). All nanorods were analyzed in-situ on the same substrate using the same experimental parameters which allowed for accurate comparison. ZnO:Ga nanorods displayed the largest SE emission intensity as well as the greatest BSE emission intensity. Hydrogen plasma treatment reduced both SE and BSE emission intensity, whereas oxygen plasma treatment only reduced SE emission. These effects may help elucidate various optical as well as biological interactions of ZnO:Ga nanorods.
Keywords: AFM; correlative microscopy; plasma treatment; SEM; ZnO nanorods
Project no.: 8X23025, SAV-23-13 (CEP)
Funding provider: GA MŠk, AV ČR
Host item entry: NANOCON 2023 Conference Proceedings, ISBN 978-80-88365-15-0, ISSN 2694-930X
Note: Související webová stránka: https://www.confer.cz/nanocon/2023/4762-correlative-afm-in-sem-analysis-of-plasma-treated-gallium-doped-zinc-oxide
Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: https://hdl.handle.net/11104/0355682
Permalink: http://www.nusl.cz/ntk/nusl-651452
The record appears in these collections:
Research > Institutes ASCR > Institute of Physics
Conference materials > Papers
Authors: Rutherford, D. ; Remeš, Zdeněk ; Mičová, J. ; Ukraintsev, E. ; Rezek, B.
Document type: Papers
Conference/Event: NANOCON 2023 - International Conference on Nanomaterials - Research & Application /15./, Brno (CZ), 20231018
Year: 2024
Language: eng
Abstract: Correlative Probe Electron Microscopy (CPEM) was used to investigate the topographical and electronic emission properties of gallium-doped zinc oxide nanorods (ZnO:Ga) after low pressure hydrogen or oxygen plasma treatment. Simultaneous secondary electron (SE) and back-scattered electron (BSE) emission information from the same nanorods enabled true correlation with the topographical information obtained by atomic force microscopy (AFM). All nanorods were analyzed in-situ on the same substrate using the same experimental parameters which allowed for accurate comparison. ZnO:Ga nanorods displayed the largest SE emission intensity as well as the greatest BSE emission intensity. Hydrogen plasma treatment reduced both SE and BSE emission intensity, whereas oxygen plasma treatment only reduced SE emission. These effects may help elucidate various optical as well as biological interactions of ZnO:Ga nanorods.
Keywords: AFM; correlative microscopy; plasma treatment; SEM; ZnO nanorods
Project no.: 8X23025, SAV-23-13 (CEP)
Funding provider: GA MŠk, AV ČR
Host item entry: NANOCON 2023 Conference Proceedings, ISBN 978-80-88365-15-0, ISSN 2694-930X
Note: Související webová stránka: https://www.confer.cz/nanocon/2023/4762-correlative-afm-in-sem-analysis-of-plasma-treated-gallium-doped-zinc-oxide
Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: https://hdl.handle.net/11104/0355682
Permalink: http://www.nusl.cz/ntk/nusl-651452
The record appears in these collections:
Research > Institutes ASCR > Institute of Physics
Conference materials > Papers
Record created 2024-09-06, last modified 2024-09-06