Název: Correlative probe electron microscopy analysis of plasma-treated gallium-doped zinc oxide nanorods
Autoři: Rutherford, D. ; Remeš, Zdeněk ; Mičová, J. ; Ukraintsev, E. ; Rezek, B.
Typ dokumentu: Příspěvky z konference
Konference/Akce: NANOCON 2023 - International Conference on Nanomaterials - Research & Application /15./, Brno (CZ), 20231018
Rok: 2024
Jazyk: eng
Abstrakt: Correlative Probe Electron Microscopy (CPEM) was used to investigate the topographical and electronic emission properties of gallium-doped zinc oxide nanorods (ZnO:Ga) after low pressure hydrogen or oxygen plasma treatment. Simultaneous secondary electron (SE) and back-scattered electron (BSE) emission information from the same nanorods enabled true correlation with the topographical information obtained by atomic force microscopy (AFM). All nanorods were analyzed in-situ on the same substrate using the same experimental parameters which allowed for accurate comparison. ZnO:Ga nanorods displayed the largest SE emission intensity as well as the greatest BSE emission intensity. Hydrogen plasma treatment reduced both SE and BSE emission intensity, whereas oxygen plasma treatment only reduced SE emission. These effects may help elucidate various optical as well as biological interactions of ZnO:Ga nanorods.
Klíčová slova: AFM; correlative microscopy; plasma treatment; SEM; ZnO nanorods
Číslo projektu: 8X23025, SAV-23-13 (CEP)
Poskytovatel projektu: GA MŠk, AV ČR
Zdrojový dokument: NANOCON 2023 Conference Proceedings, ISBN 978-80-88365-15-0, ISSN 2694-930X
Poznámka: Související webová stránka: https://www.confer.cz/nanocon/2023/4762-correlative-afm-in-sem-analysis-of-plasma-treated-gallium-doped-zinc-oxide

Instituce: Fyzikální ústav AV ČR (web)
Informace o dostupnosti dokumentu: Dokument je dostupný v příslušném ústavu Akademie věd ČR.
Původní záznam: https://hdl.handle.net/11104/0355682

Trvalý odkaz NUŠL: http://www.nusl.cz/ntk/nusl-651452