Original title: An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials
Authors: Allaham, Mohammad M. ; Košelová, Zuzana ; Sobola, Dinara ; Fohlerová, Zdenka ; Knápek, Alexandr
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: The absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes.
Keywords: absorption coefficient; and reflectance; energy gap; Tauc plot; transmittance; Urbach tailing energy
Host item entry: Proceedings II of the 30st Conference STUDENT EEICT 2024: Selected papers, ISBN 978-80-214-6230-4, ISSN 2788-1334

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: https://hdl.handle.net/11012/249311

Permalink: http://www.nusl.cz/ntk/nusl-622569


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