Original title: Optimization of Parameters Used in the Application of Elimination Voltammetry with Linear Scan
Authors: Navrátil, Tomáš ; Trnková, L. ; Hrdlička, Vojtěch ; Li, X.
Document type: Papers
Conference/Event: Modern Electrochemical Methods /43./, Jetřichovice (CZ), 20240520
Year: 2024
Language: eng
Abstract: Elimination Voltammetry with Linear Scan (EVLS) is a well-established mathematical method that aids in understanding an analyzed electrochemical system. In almost 30 years since its derivation, it has become a “black-box” technique that is applied automatically (in most cases due to its incorporation into a voltammetric software) without thinking about its fundamentals. However, the choice of optimum parameters under which DC voltammetric data (from which elimination curves are calculated) is crucial. This contribution deals with revealing the optimum ratio of applied scan rates and their absolute values (i.e., times of recording) in dependence on the character of the investigated system (diffusion-controlled process, adsorption-controlled process, etc.).
Keywords: adsorption; elimination voltammetry with linear scan; optimization
Host item entry: Proceedings of the International Conference. 43rd Modern Electrochemical Methods, ISBN 978-80-908947-1-6

Institution: J. Heyrovsky Institute of Physical Chemistry AS ČR (web)
Document availability information: Fulltext is available on demand via the digital repository of the Academy of Sciences.
Original record: https://hdl.handle.net/11104/0353836

Permalink: http://www.nusl.cz/ntk/nusl-615868


The record appears in these collections:
Research > Institutes ASCR > J. Heyrovsky Institute of Physical Chemistry
Conference materials > Papers