Original title:
Microstrains and x-ray diffraction
Authors:
Drahokoupil, J. ; Čerňanský, Marian ; Kolařík, K. Document type: Papers Conference/Event: Experimental Stress Analysis 2009, Sychrov (CZ), 2009-06-08 / 2009-06-11
Year:
2009
Language:
eng Abstract:
An attention is paid to the microstrain – its effect on X-ray diffraction and a method to its estimation from a broadening of diffraction lines. Especially, the single line Voigt function method is presented for the estimation of the microstrain and crystallite size from a single diffraction line.
Keywords:
microstrain; single line; Voigt function; x-ray diffraction Project no.: CEZ:AV0Z10100520 (CEP), GA106/07/0805 (CEP) Funding provider: GA ČR Host item entry: Proceedings of 47th international Scientific conference Experimental Stress Analysis 2009, ISBN 978-80-7372-483-2
Institution: Institute of Physics AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0194601