Original title: Microstrains and x-ray diffraction
Authors: Drahokoupil, J. ; Čerňanský, Marian ; Kolařík, K.
Document type: Papers
Conference/Event: Experimental Stress Analysis 2009, Sychrov (CZ), 2009-06-08 / 2009-06-11
Year: 2009
Language: eng
Abstract: An attention is paid to the microstrain – its effect on X-ray diffraction and a method to its estimation from a broadening of diffraction lines. Especially, the single line Voigt function method is presented for the estimation of the microstrain and crystallite size from a single diffraction line.
Keywords: microstrain; single line; Voigt function; x-ray diffraction
Project no.: CEZ:AV0Z10100520 (CEP), GA106/07/0805 (CEP)
Funding provider: GA ČR
Host item entry: Proceedings of 47th international Scientific conference Experimental Stress Analysis 2009, ISBN 978-80-7372-483-2

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0194601

Permalink: http://www.nusl.cz/ntk/nusl-42489


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Research > Institutes ASCR > Institute of Physics
Conference materials > Papers