Original title: Mapping of the microscopic strain using scanning low energy electron microscopy
Authors: Mikmeková, Šárka ; Hovorka, Miloš ; Müllerová, Ilona ; Frank, Luděk ; Man, O. ; Pantělejev, L. ; Kouřil, M.
Document type: Papers
Conference/Event: Mikroskopie 2010, Nové Město na Moravě (CZ), 2010-02-17 / 2010-02-18
Year: 2010
Language: eng
Abstract: Detection of a strain in the microscopic scale is very important under multiple circumstances.
Keywords: SEM; SLEEM; UFG
Project no.: CEZ:AV0Z20650511 (CEP)
Host item entry: Mikroskopie 2010, ISBN N

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0006216

Permalink: http://www.nusl.cz/ntk/nusl-42289


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers