Original title: Optical and scanning electron microscopies in examination of ultrathin foils
Authors: Konvalina, Ivo ; Hovorka, Miloš ; Fořt, Tomáš ; Müllerová, Ilona
Document type: Papers
Conference/Event: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr (CZ), 2010-05-31 / 2010-06-04
Year: 2010
Language: eng
Abstract: Very low energy scanning transmission electron microscopy is emerging as a novel tool for examination of ultrathin foils to learn more about the electron structure of solids. The electron micrographs provide image contrasts governed by the effective thickness of the sample proportional to the inner potential and at lowest energies the local density of electron states in the direction of impact of the electron wave starts to dominate. The optical methods are used during the sample preparation. The laser confocal microscope Olympus Lext OLS 3100 was used for preliminary observations of the 3 nm C foil prepared by magnetron sputtering in nitrogen atmosphere on a flat glass covered by a disaccharide layer.
Keywords: laser confocal microscope; ultrathin foils; very low energy scanning transmission electron microscopy
Project no.: CEZ:AV0Z20650511 (CEP), IAA100650902 (CEP)
Funding provider: GA AV ČR
Host item entry: Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-254-6842-5

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0190600

Permalink: http://www.nusl.cz/ntk/nusl-41921


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers