Original title: Spectrum Analysis Of Damaged Led Light Sources
Authors: Janík, Daniel
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: Permanent damage to LED chips, often high temperature is one of the common problems. The article compares the spectrum of LED retrofits before and after permanent high temperature damage. Several different samples tested were damaged by the same defined temperature during operation. The radiated spectrum was measured before and after exposure to the temperature and subsequently evaluated.
Keywords: LED light sources; LED retrofit; permanent damage
Host item entry: Proceedings of the 25st Conference STUDENT EEICT 2019, ISBN 978-80-214-5735-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/186762

Permalink: http://www.nusl.cz/ntk/nusl-414664


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Conference materials > Papers
 Record created 2020-07-11, last modified 2021-08-22


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