Original title: Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope
Authors: Pokorná, Zuzana ; Frank, Luděk
Document type: Papers
Conference/Event: CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./, Brno (CZ), 2009-08-10 / 2009-08-14
Year: 2009
Language: eng
Abstract: Single crystal and polycrystalline aluminium samples were imaged in the scanning low energy electron microscopes at energies of impinging electrons ranging between 0 and 90 eV. The integrated image signal at each energy was calculated and the resulting reflectance curves were compared to electron structure calculations. The influence of vacuum conditions and cleanliness of the substrate surface are discussed.
Keywords: polycrystalline aluminium; scanning low energy electron microscopes
Project no.: CEZ:AV0Z20650511 (CEP)
Host item entry: Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09), ISBN 978-80-254-4535-8

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0179804

Permalink: http://www.nusl.cz/ntk/nusl-40970


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers