Název:
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Autoři:
Rodenburg, C. ; Masters, R. ; Abrams, K. ; Dapor, M. ; Krátký, Stanislav ; Mika, Filip Typ dokumentu: Příspěvky z konference Konference/Akce: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr (CZ), 20180604
Rok:
2018
Jazyk:
eng
Abstrakt: A link between peaks in secondary electron (SE) spectra and Electron Energy Loss Spectra\n(EELS) was shown decades ago. Also, materials properties (bulk modulus, band gap)\ncorrelate with the bulk plasmon position in EELS, and local modulus maps in carbon fibres\nhave been presented. If any features as result of plasmon decay into SE can be identified,\nSE spectroscopy combined with hyperspectral imaging could transform the SEM into a tool\nfor mapping materials properties with ground-breaking potential for nanotechnology. To\nbecome a reality, we first need to establish SE collection conditions spectra that represent a\nmaterial reliably. Second, we need to gain a better understanding of the processes involved in the SE emission processes.
Klíčová slova:
hyperspectral imaging; polymers; secondary electrons Zdrojový dokument: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar, ISBN 978-80-87441-23-7
Instituce: Ústav přístrojové techniky AV ČR
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Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0288492