Original title: Optimization of Secondary Electron Detection by Segmental lonization Detector in Environmental SEM
Translated title: Optimalizace detekce sekundárních elektronů segmentovým ionizačním detektorem v environmentálním REM
Authors: Černoch, P. ; Jirák, Josef
Document type: Papers
Conference/Event: Multinational Congress on Microscopy /8./, Prague (CZ), 2007-06-17 / 2007-06-21
Year: 2007
Language: eng
Abstract: [eng] [cze]

Keywords: environmental SEM; secondary electron detection; segmental ionization detector
Project no.: CEZ:AV0Z20650511 (CEP), GA102/05/0886 (CEP)
Funding provider: GA ČR
Host item entry: Proceedings of the 8th Multinational Congress on Microscopy, ISBN 978-80-239-9397-4

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0152866

Permalink: http://www.nusl.cz/ntk/nusl-37984


The record appears in these collections:
Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers
 Record created 2011-07-01, last modified 2024-01-26


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