Original title: Depozice a charakterizace tenkých vrstev a jejich analýza za pomoci skenovací elektronové mikroskopie
Translated title: Techniques of thin layers deposition and characterization, their analysis using scanning electron microscopy
Authors: Kiška, Roman ; Moravčík, Igor (referee) ; Čupera, Jan (advisor)
Document type: Bachelor's theses
Year: 2018
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta strojního inženýrství
Abstract: [cze] [eng]

Keywords: adhesion; AFM; CVD; nanohardness; PVD; roughness; SEM; Young’s modulus of elasticity; adheze; AFM; CVD; drsnost; nanotvrdost; PVD; SEM; Youngův modul pružnosti

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/82337

Permalink: http://www.nusl.cz/ntk/nusl-378421


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2018-06-19, last modified 2022-09-04


No fulltext
  • Export as DC, NUŠL, RIS
  • Share