Original title: Electron Ray-Tracing for Numerical Determination of Aberrations
Authors: Mynář, M. ; Vašina, R. ; Kolařík, Robert ; Lencová, Bohumila
Document type: Papers
Conference/Event: EUREM /12./ - European Congress on Electron Microscopy, Brno (CZ), 2000-07-09 / 2000-07-14
Year: 2000
Language: eng
Abstract: Analytical computation of aberation of electrostatic and magnetostatic lenses is widely accepted and used. However, the determination of aberration coefficients from direct ray-tracing of optical elements with a curved optical axis, elements with overlapping electrostatic and magnetostatic fields, cathode lenses and electrostatic mirrors can bring benefits over the analytical methods.
Project no.: CEZ:AV0Z2065902 (CEP), IAA1065804 (CEP), CT97-0700
Funding provider: GA AV ČR, IC15
Host item entry: Proceedings of the 12th European Congress on Electron Microscopy, ISBN 80-238-5503-4
Note: Související webová stránka: mailto:robert@isibrno.cz

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0100859

Permalink: http://www.nusl.cz/ntk/nusl-29461


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