Original title:
Electron Ray-Tracing for Numerical Determination of Aberrations
Authors:
Mynář, M. ; Vašina, R. ; Kolařík, Robert ; Lencová, Bohumila Document type: Papers Conference/Event: EUREM /12./ - European Congress on Electron Microscopy, Brno (CZ), 2000-07-09 / 2000-07-14
Year:
2000
Language:
eng Abstract:
Analytical computation of aberation of electrostatic and magnetostatic lenses is widely accepted and used. However, the determination of aberration coefficients from direct ray-tracing of optical elements with a curved optical axis, elements with overlapping electrostatic and magnetostatic fields, cathode lenses and electrostatic mirrors can bring benefits over the analytical methods. Project no.: CEZ:AV0Z2065902 (CEP), IAA1065804 (CEP), CT97-0700 Funding provider: GA AV ČR, IC15 Host item entry: Proceedings of the 12th European Congress on Electron Microscopy, ISBN 80-238-5503-4 Note: Související webová stránka: mailto:robert@isibrno.cz
Institution: Institute of Scientific Instruments AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0100859