Original title: SMV-2016-20: Výpočty detekčních systémů rastrovacích elektronových mikroskopů
Translated title: SMV-2016-20: Simulation of detection systems of scanning electron microscopes
Authors: Radlička, Tomáš ; Oral, Martin ; Rozbořil, Jakub
Document type: Research reports
Year: 2016
Language: cze
Abstract: [cze] [eng]

Keywords: contrast optimization; electron microscopy; electron optics

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0266308

Permalink: http://www.nusl.cz/ntk/nusl-262491


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Research > Institutes ASCR > Institute of Scientific Instruments
Reports > Research reports
 Record created 2017-01-11, last modified 2021-11-24


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