Original title: Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass
Authors: Vaněček, Milan ; Holovský, Jakub ; Poruba, Aleš ; Remeš, Zdeněk ; Purkrt, Adam
Document type: Research reports
Year: 2015
Language: eng
Abstract: Optical and photoelectrical properties of materials from TEL Solar were characterized in the Institute of Physics, AS CR in a broad spectral region and a high dynamic range. Conclusions on material properties with respect to thin film silicon solar cells were drawn.
Keywords: amorphous silicon; microcrystalline silicon; optical properties; ZnO

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0258426

Permalink: http://www.nusl.cz/ntk/nusl-203304


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Research > Institutes ASCR > Institute of Physics
Reports > Research reports