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	Structure of submicrocrystalline materials studied by X-ray diffraction Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee) Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films. Detailed record
	Microstructure of Submicrocrystalline Metals after Severe Plastic Deformation and Its Thermal Stability Cherkaska, Viktoriya ; Kužel, Radomír (advisor) ; Ganev, Nikolaj (referee) ; Čerňanský, Marian (referee) Detailed record
	Structure of submicrocrystalline materials studied by X-ray diffraction Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee) Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films. Detailed record
	Approximations of Fourier coefficients of diffractions profiles Čerňanský, Marian Approximations in the Warren-Averbach interpretation of Fourier coeeficients of diffraction profiles are briefly summarized. It is shown, that certain approximations of a course of Fourier coefficients enable estimate of crystallite size and microstrain only from a single diffraction line. Detailed record
	Microstresses and x-ray diffraction Drahokoupil, J. ; Čerňanský, Marian ; Ganev, N. ; Kolařík, K. ; Pala, Z. The description of an influence of microstresses and macrostresses on diffraction line profiles. Depth distribution of residual stresses in the shot-peened steel obtained by X-ray diffraction. Detailed record
	Microstrains and x-ray diffraction Drahokoupil, J. ; Čerňanský, Marian ; Kolařík, K. An attention is paid to the microstrain – its effect on X-ray diffraction and a method to its estimation from a broadening of diffraction lines. Especially, the single line Voigt function method is presented for the estimation of the microstrain and crystallite size from a single diffraction line. Detailed record
	Kompletní rentgenové studium pole zbytkového napětí způsobeného balotinováním ocelí Ganev, N. ; Čerňanský, Marian ; Drahokoupil, Jan ; Kolařík, K. The contribution informs about a contemporaneous depth profile determination of both, the macro/ and microscopic residual stresses insurface layers. The results obtained indicate that depth distributions of both the quantities in surface layers are dissimilar. Detailed record
	Contribution to diffraction analysis of macroscopic and microscopic residual stresses in surface layers of shot-peened steels Ganev, N. ; Čerňanský, Marian ; Drahokoupil, Jan ; Kolařík, K. The description and the results of the study of depth profiles of residual stresses in surface layers of shot-peened steels. The influence of the intensity of shot peening and correlations between the absolute values of macroscopic and microscopic stresses on surfaces of materials were studied. Detailed record
	Gradienty zbytkových napětí a nanotvrdosti v povrchových vrstvách leštěných vzorků ocelí Ganev, N. ; Čerňanský, Marian ; Drahokoupil, Jan ; Zubko, P. ; Bláhová, O. Contribution presents results of analysis of residual stress and nanohardness gradients in surface layers of polished steel samples. It shows, that macrostress, microstrain and microhardness are inhomogeneous towards depth in the polished surface layers. Detailed record
	A comparison of methods for particle size determination Čerňanský, Marian ; Holý, V. ; Kub, Jiří ; Kuběna, J. Detailed record

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2	Čerňanský, Michal

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