Original title: Microstresses and x-ray diffraction
Authors: Drahokoupil, J. ; Čerňanský, Marian ; Ganev, N. ; Kolařík, K. ; Pala, Z.
Document type: Papers
Conference/Event: Experimental Stress Analysis 2008 /46./, Horní Bečva (CZ), 2008-06-02 / 2008-06-05
Year: 2008
Language: eng
Abstract: The description of an influence of microstresses and macrostresses on diffraction line profiles. Depth distribution of residual stresses in the shot-peened steel obtained by X-ray diffraction.
Keywords: depth distribution; microstress and macrostress; shot peening; x-ray diffraction
Project no.: CEZ:AV0Z10100520 (CEP), GA106/07/0805 (CEP)
Funding provider: GA ČR
Host item entry: Proceedings of the 46th International Scientific Conference Experimental Stress Analysis 2008, ISBN 978-80-248-1774-3

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0194635

Permalink: http://www.nusl.cz/ntk/nusl-42502


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Research > Institutes ASCR > Institute of Physics
Conference materials > Papers