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Original title:
Microstresses and x-ray diffraction
Authors:
Drahokoupil, J.
;
Čerňanský, Marian
;
Ganev, N.
;
Kolařík, K.
;
Pala, Z.
Document type:
Papers
Conference/Event:
Experimental Stress Analysis 2008 /46./
, Horní Bečva (CZ), 2008-06-02 / 2008-06-05
Year:
2008
Language:
eng
Abstract:
The description of an influence of microstresses and macrostresses on diffraction line profiles. Depth distribution of residual stresses in the shot-peened steel obtained by X-ray diffraction.
Keywords:
depth distribution
;
microstress and macrostress
;
shot peening
;
x-ray diffraction
Project no.:
CEZ:AV0Z10100520
(
CEP
),
GA106/07/0805
(
CEP
)
Funding provider:
GA ČR
Host item entry:
Proceedings of the 46th International Scientific Conference Experimental Stress Analysis 2008, ISBN 978-80-248-1774-3
Institution:
Institute of Physics AS ČR (
web
)
Document availability information:
Fulltext is available at the institute of the Academy of Sciences.
Original record:
http://hdl.handle.net/11104/0194635
Permalink:
http://www.nusl.cz/ntk/nusl-42502
The record appears in these collections:
Research
>
Institutes ASCR
>
Institute of Physics
Conference materials
>
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Record created 2011-07-04, last modified 2024-01-26
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