Název:
Very low energy STEM/TOF system
Autoři:
Daniel, Benjamin ; Radlička, Tomáš ; Piňos, Jakub ; Frank, Luděk ; Müllerová, Ilona Typ dokumentu: Příspěvky z konference Konference/Akce: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr (CZ), 20160529
Rok:
2016
Jazyk:
eng
Abstrakt: Scanning low energy electron microscopes (SLEEMs) have been built at ISI for over 20 years, either by modification of commercially available SEMs with a cathode lens or completely self-built in case of a dedicated ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). Recently, the range of detection methods has been extended\nby a detector for electrons transmitted through ultrathin films and 2D crystals like graphene. For a better understanding of interaction between low energy electrons and solids in general, and the image contrast mechanism in particular, it was considered useful to measure the energy of transmitted electrons. This allows a better comparison with simulations, which suffer from increasing complexity due to a stronger interaction of electrons with the density of states at low energies.
Klíčová slova:
elecvtron microscopy; SLEEM; UHV SLEEM Číslo projektu: 606988 Zdrojový dokument: Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-87441-17-6 Poznámka: Související webová stránka: http://www.trends.isibrno.cz/
Instituce: Ústav přístrojové techniky AV ČR
(web)
Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0260331