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Charge Exchange processes involved in projectile-target interaction at low energy range studied by HS-LEIS
Bábík, Pavel ; Král, Jaroslav (referee) ; Průša, Stanislav (advisor)
This diploma thesis is focused on the charge exchange processes between projectile and target studied by the Low Energy Ion Scattering (LEIS) technique. Basic premise to investigate charge exchange processes is correct cleaning processes and proper settings of experimental instrument Qtac 100 placed in the Central European Institute of Technology (CEITEC) in Brno. Ion fraction expresses neutralization rate of the projectile. The parametr is investigated for clean and oxidized polycrystalline copper. Oxygen presence performs a significant part of reionization of backscattered neutralized projectiles.
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Electron Beam Control and Diagnostics for Advanced Technologies
Zobač, Martin ; Kolařík, Vladimír (referee) ; Průša, Stanislav (referee) ; Lencová, Bohumila (advisor)
The thesis deals with problems of control and diagnostics of electron beam technological devices which use electron beam for localised intensive heating of a material. A brief description of the electron beam welder MEBW-60/2 is included; the author has participated on its development and implementation. Main topics are the analysis of deflection system properties and the measurement of current distribution of the beam (so-called beam profiles). Geometrical aberrations, hysteresis, stability and dynamics of a single-stage magnetic x-y deflection system are described. Suitable measurement procedures and correction methods are introduced. Methods of transverse and longitudinal beam profile acquisition is presented using successive sampling of the local current density of the beam by a modified Faraday cup. The data processing and evaluation of characteristic beam parameters are shown. The presented methods were verified by fourteen experiments using the electron beam welder. The methods have proven to be useful in practical evaluation of the device properties.
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Low Energy Ion Scattering on Gold Structures
Joch, Vítězslav ; Čech, Vladimír (referee) ; Průša, Stanislav (advisor)
This diploma thesis deals with comparison of experimental and simulated low energy ion scattering spectra. There is a theoretical description of basic principles of low energy ion scattering and description of the spectrometer, which is situated at Institute of physical engineering. It is shown, how to prepare samples using the colloidal gold solution. The deposition of gold nanoparticles is characterized. The usage and meaning of time and energy spectra of low energy ion scattering is explained. There is also shown the effect of channeling in Si substrate.
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Studies of molecular beams of organic materials
Maniš, Jaroslav ; Průša, Stanislav (referee) ; Mach, Jindřich (advisor)
This bachelor's thesis deals with assembling of low-temperature efussion cell which is suitable for deposition of organic materials. The calibration of operating temperature of effusion cell is performed. Depositions of organic semiconductor material are realized. Morphology of surface of thin film is studied in AFM and SEM microscope. In the paper background research on the utilization of organic materials in semiconductor industry is presented.
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An influence of electron beam on thin oxide films
Kostyal, Michal ; Průša, Stanislav (referee) ; Čechal, Jan (advisor)
This bachelor work deals with a study of the influence of electron beam of scanning electron microscope on the surface of the SiO2/Si (100) – sample. In the work the electron and atomic force microscopy briefly described. The main objective of experimental part is to describe variation in the brightness of sample SiO2/Si (100) in Scanning electron microscope images. In this study is found that on the sample surface are created objects few nm high. The rest of the work is then devoted to measuring the dependence of the object’s high on different variables. Experiments are generally based on the selective irradiation of the sample surface by scanning electron microscope, measurement of irradiated parts using atomic force microscope and evaluation in the application Gwyddion.
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