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Self-Testing of Microcontrollers
Denk, Filip ; Šimek, Václav (referee) ; Strnadel, Josef (advisor)
This Master's thesis deals with functional safety of electronic systems. Specifically, it focuses on self-testing of the microprocessor and its peripherals at the software level. The main aim of the thesis is to design and implement a set of functions written in programming language C or assembly language, which automatically test the selected areas of the microcontroller. Resources and methods used in the implemented solution also aim to meet the requirements according to the safety standard IEC 60730-1, Annex H, Software Class B. The microcontroller NXP LPC55S69 was chosen as a hardware platform. It consists of two ARM Cortex-M33 cores. As a result, the example application is provided, which uses implemented test functions at the run-time. Example application also contains a graphical user interface with fault injection ability.
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Self-Test for Automatic Industrial Tester
Kyselý, Tomáš ; Dušek, Martin (referee) ; Povalač, Aleš (advisor)
Work discusses about the test station in NXP Semiconductors Company in Rožnov pod Radhoštěm. It describes first the test station itself and its possibilities in software libraries testing. Second it describes automatic selftest of this station and sub-steps of this selftest. This work is also used as a documentation for company needs. KEYWORDS
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Self-Testing of Microcontrollers
Denk, Filip ; Šimek, Václav (referee) ; Strnadel, Josef (advisor)
This Master's thesis deals with functional safety of electronic systems. Specifically, it focuses on self-testing of the microprocessor and its peripherals at the software level. The main aim of the thesis is to design and implement a set of functions written in programming language C or assembly language, which automatically test the selected areas of the microcontroller. Resources and methods used in the implemented solution also aim to meet the requirements according to the safety standard IEC 60730-1, Annex H, Software Class B. The microcontroller NXP LPC55S69 was chosen as a hardware platform. It consists of two ARM Cortex-M33 cores. As a result, the example application is provided, which uses implemented test functions at the run-time. Example application also contains a graphical user interface with fault injection ability.
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The View of Older School Age Student to Teacher's Personality
Jarošová, Veronika ; Krykorková, Hana (advisor) ; Koťa, Jaroslav (referee)
The older school age is very considerable in terms of developmental psychology. The pupil's characteristics require an adequate reaction, a specific attitude and a psychological knowledge of the teacher. Pupils have some ideas of the teacher's personality, which may not correspond with the requirements imposed by experts. The presented work defines the factors, that are likely to affect the perspective of the learner of older school age to the personality of the teacher. There are recommendations, how to deal with the undesirable factors and generate or enhance the positive factors as well, so that it would indemnify the necessary positive relationship of the older school age pupil with the teacher.
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Self-Test for Automatic Industrial Tester
Kyselý, Tomáš ; Dušek, Martin (referee) ; Povalač, Aleš (advisor)
Work discusses about the test station in NXP Semiconductors Company in Rožnov pod Radhoštěm. It describes first the test station itself and its possibilities in software libraries testing. Second it describes automatic selftest of this station and sub-steps of this selftest. This work is also used as a documentation for company needs. KEYWORDS
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