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Multi-electrode system of ionization detector for environmental scanning electrone microscope
Uhlář, Vít ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
Thesis deals with environmental scanning electron microscopy and with detection of signal electrons by using ionization detector. First part talks about the principle of environmental scanning electron microscope. Second part describes signals generated by interaction of primary electron beam with sample. Third section explains the principle of impact ionization and ionization detector. Experimental part deals with usage of segmental ionization detector and with measuring of signal amplification from copper and platinum. Thesis also examines arrangement of electrodes of ionisation detector on material contrast and examines also on influence of voltage contrast on base - emitter junction of an NPN bipolar transistor. All experiments were carried out in dependency on saturated water vapour pressure in sample chamber.
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Comparison of microscopic diagnostic methods
Veselý, Jakub ; Tihlaříková, Eva (referee) ; Čudek, Pavel (advisor)
This thesis deals with the description and comparison of diagnostic methods, transmission electron microscopy, scanning electron microscopy and atomic force microscopy. The introduction is a description of diagnostic methods. The following experimental section dealing with the diagnosis of ferritic chromium steel sample methods of scanning electron microscopy, atomic force microscopy, transmission electron microscopy and the evaluation and interpretation of measured results. The conclusion provides a comparison, the advantages and disadvantages of diagnostic methods.
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Signal Detection by Segmental Ionization Detector in Environmental SEM
Černoch, Pavel ; Jirák, Josef (advisor)
The dissertation thesis deals with signal detection by an ionization detector in the environmental scanning electron microscope and utilization of this detector to gain required information in a specimen image. Main interest is focused on the detector containing several electrodes with a varied geometry arrangement and voltages on these electrodes. The detector was named segmental ionization detector. Detection capabilities of the segmental ionization detector were studied through computer simulations and experiments in the microscope utilizing knowledge from a technical literature background. On the base of the accomplished experiments, the segmental ionization detector has been optimized for the secondary electron detection improvement and at another configuration optimized for a high material contrast acquisition of the specimen image. Consideration of benefits of the examined segmental ionization detectors is included in the work.
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Scintillation SE detector for ESEM
Odehnal, Adam ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
Thesis deals with theoretical knowledge about scanning electron microscopy and environmental scanning electron microscopy. It describes principle of operation, signals generated by interaction between primary electron beam and specimen and means of detection of secondary electron signal in environmental conditions using scintillation detector. Furthermore, thesis focuses on optimization of detection od secondary electrons by adjusting electrode system of scintillation detector. Computer program Simion is used for modelling signal electron trajectories for proper adjustments. Simulation were starting-point for adjusting the design of the detector. Detection efficiency of adjusted detector was determined by evaluating signal magnitude from captured images, secondary electron detection capability from voltage contrast and quality of the captured images from signal/noise ratio.
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Using Cosmos FloWorks for analyse the detector.
Bordovský, Petr ; Špinka, Jiří (referee) ; Maxa, Jiří (advisor)
This work deal with the analysis of influence of pressure‘s sizes in vacuum chamber of specimen Evironmental Scanning Electron Microscope and the influence of sizes of aperture diaphragm by scintillation detector. The analysis proceeds in detector of secondary electrons. The detector is modelled by system 3D CAD SolidWorks with the help of system CAE Cosmos FloWorks.
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Ionization detector for environmental scanning electron microscope
Melechovský, Ondřej ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
Presented work deals with environmental scanning electron microscopy. The construction of the device is described concisely in the beginning. Important part is devoted to interaction of electrons with specimen and signals emitted from the specimen. The work aims especially at detection of secondary electrons using the ionization detector. Experimentally is determined effect of working environment and size of electrode system of ionization detector on detected signal.
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Ionization detector for ESEM
Pokluda, Tomáš ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis is focused on the environmental scanning electron microscopes including a description of the basic physical mechanisms. It describes the design and realization of the electrode ionization detector system suitable for the detection of signal electrons with a greater proportion of secondary electrons. It also deals with simulations of trajectories of electrons in the electrostatic field of the detector, and with verification of the functionality of the detector in the environment of water vapors in the specimen chamber of the electron microscope.
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Analysis of active material for batteries by EDS
Vídeňský, Ondřej ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This master thesis deals with analysis of battery mass using x-ray spectral microanalysis. For the measurement two scanning electron microscopes equipped with energy dispersive x-ray spectroscopes were used. Appropriate examples were prepaired by standard method. Then elemental analysis was performed with changing conditions of measurement. Two programs were used for spectrums evaluation and in the end the size of errors was observed for every conditions.
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Comparison of microscopic diagnostic methods
Veselý, Jakub ; Tihlaříková, Eva (referee) ; Čudek, Pavel (advisor)
This thesis deals with the description and comparison of diagnostic methods, transmission electron microscopy, scanning electron microscopy and atomic force microscopy. The introduction is a description of diagnostic methods. The following experimental section dealing with the diagnosis of ferritic chromium steel sample methods of scanning electron microscopy, atomic force microscopy, transmission electron microscopy and the evaluation and interpretation of measured results. The conclusion provides a comparison, the advantages and disadvantages of diagnostic methods.
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