|
| |
|
|
Evaluation of structures of solder joint with printed board circuit
Jakubec, Jiří ; Jirák, Josef (referee) ; Černoch, Pavel (advisor)
The theoretical part of the diploma thesis deals with the basic principles of the scanning electron microscope and the environmental scanning electron microscope. A description of the signals generated by an electrons incidence onto a specimen and detection options of these signals in the mentioned microscopes is included in the work. The experimental part of the work concerns an examination of a quality of several joints soldered by different methods on the printed circuit boards after different stresses by use of a visual check and the instruments of the light microscope and the environmental scanning electron microscope. The acquired data are evaluated and summarized.
|
|
|
Detection of Signal Electrons in High Pressure Conditions in Environmental Scanning Electron Microscopy
Neděla, Vilém ; Jirák, Josef (advisor)
The thesis deals with the study of properties of a new system for detection of true secondary and backscattered electrons in high pressure conditions of the specimen chamber of a newly built environmental scanning electron microscope AQUASEM II. Detection system contains three detectors. For the first time is introduced and analyzed the working principle of ionisation detector with electrostatic separator, which is in many experiments compared with ionisation detector of secondary electrons. Experimentally demonstrated are unique properties of this detection system, especially the ability of energy separation of detected signal electrons. For the various working conditions are also analyzed signal levels detected by the BSE YAG detector, which is designed as a part of the new detection system and which worked together with both ionisation detectors.
|
|
| |
|
|
Evaluation of structures of solder joint with printed board circuit
Jakubec, Jiří ; Jirák, Josef (referee) ; Černoch, Pavel (advisor)
The theoretical part of the diploma thesis deals with the basic principles of the scanning electron microscope and the environmental scanning electron microscope. A description of the signals generated by an electrons incidence onto a specimen and detection options of these signals in the mentioned microscopes is included in the work. The experimental part of the work concerns an examination of a quality of several joints soldered by different methods on the printed circuit boards after different stresses by use of a visual check and the instruments of the light microscope and the environmental scanning electron microscope. The acquired data are evaluated and summarized.
|
guest ::
