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National Repository of Grey Literature 3 records found  Search took 0.01 seconds. 
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record
Method for evaluation of signal level value in environmental SEM
 Kršňák, Jiří ; Tihlaříková, Eva (referee) ; Čudek, Pavel (advisor)
This work deals with the evaluating of the signal level value from the sample in the environmental SEM. In work there were processed the comparison of the osciloscopic method for the evaluating of the signal level value in the environmental SEM, the method for the evaluating of the signal level from the grey level of the sample images and the method for the evaluating of the signal level from the osciloscop. There are described the advantages and disadvantages of the methods and procedures for processing the methods.
Detailed record
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record

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