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Development and applications of near-field imaging methods in the terahertz spectral domain
Berta, Milan ; Kadlec, Filip (advisor) ; Fejfar, Antonín (referee) ; Adam, Auréle J.L. (referee)
We are reporting on a study of the near-field sensitivity and resolution of a metal-dielectric probe (MDP). The propagation of the electromagnetic field across the probe was studied experimentally by means of time-domain terahertz spectroscopy and numerically simulated by CST MicroWave Studio 2008. Several localised areas at the probe end facet were distinguished and showed to be sensitive to the local dielectric properties and local anisotropy of the sample. Contrast and sensitivity measurements were conducted in several configurations of a MDP; the results were confirmed by simulations. The acquired data were analysed by using singular value decomposition that enabled separating independent physical phenomena in the measured datasets and filtering external disturbances out of the signal. Independent components corresponding to the changes in the output terahertz pulse upon varying the probe-sample distance and reflecting the local anisotropy in a ferroelectric barium titanate (BaTiO3) crystal were extracted and identified. The domain structure with characteristic dimensions of about 5 um was resolved during imaging experiments on the ferroelectric BaTiO3 sample, i.e. the resolved structures were ten times smaller than the characteristic dimensions of the end facet of the probe and forty times smaller than...
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Mechanical and Electrical Properties of Microcrystalline Silicon Thin Films
Vetushka, Aliaksei ; Fejfar, Antonín (advisor) ; Čech, Vladimír (referee) ; Sládek, Petr (referee)
Amorphous and nano- or micro- crystalline silicon thin films are intensively studied materials for photovoltaic applications. The films are used as intrinsic layer (absorber) in p-i-n solar cells. As opposed to crystalline silicon solar cells, the thin films contain about hundred times less silicon and can be deposited at much lower temperatures (typically around 200 0 C) which saves energy needed for production and makes it possible to use various low cost (even flexible) substrates. However, these films have a complex microstructure, which makes it difficult to measure and describe the electronic transport of the photogenerated carriers. Yet, the understanding of the structure and electronic properties of the material at nanoscale is essential on the way to improve the efficiency solar cells. One of the main aims of this work is the study of the structure and mechanical properties of the mixed phase silicon thin films of various thicknesses and structures. The key parameter of microcrystalline silicon is the crystallinity, i.e., the microcrys- talline volume fraction. It determines internal structure of the films which, in turn, decides about many other properties, including charge transport and mechanical sta- bility. Raman microspectroscopy is a fast and non-destructive method for probing the...
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Interakce umělé fotosyntetické antény s akceptory elektronů
Dostál, Jakub ; Pšenčík, Jakub (advisor) ; Fejfar, Antonín (referee)
The use of bacteriochlorophyll aggregates as a sensitizer for dye-sensitized cell has been studied in this work. Bacteriochlorophyll aggregates exhibit unique light-harvesting properties combining high optical density, long-term stability and exciton delocalization. Preparation of the GrÄatzel type photovoltaic cells has been successfully managed during this research. The cells were sensitized by bacteriochlorophyll c both in monomeric and aggregated form, and were characterized by measuring photoinduced current, voltage and other properties. As a part of this work a theoretical model of reversible two-level photovoltaic cell was derived from the thermodynamic principles. Predictions of this model are compared with experimental data and with published results.
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Summary report of results of the contract research between FZU AV ČR, v.v. i. and HVM Plasma s.r.o. for 2016
Mates, Tomáš ; Fejfar, Antonín ; Ledinský, Martin ; Vetushka, Aliaksi ; Pikna, Peter ; Bauerová, Pavla
Samples of protective layers based on DLC (Diamond-like-Carbon) on different substrates (test bodies and real components) were studied by several diagnostic methods.\nRaman spectroscopy was used for the detection of bindings in order to specify the structural variations, surface modifications both for as-deposited samples and particularly for samples that underwent different stress tests.\nScanning Electron Microscope (SEM) was used to examine the surface structure of layers in different locations on the sample and to search suitable test spots for the subsequent analysis by the Atomic Force Microscope (AFM). AFM in special modes was employed to measure the maps local mechanical properties (friction, tip adhesion, energy dissipation, etc.).\nOn a selected sample, the cross-sectional structure of the sample was analysed by the Focussed Ion Beam (FIB) and the elemental composition in various thicknesses was documented by the Energy-dispersive X-ray Spectroscopy (EDS).\n
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