National Repository of Grey Literature 19 records found  1 - 10next  jump to record: Search took 0.01 seconds. 
Effect of structure on mechanical properties of covalent ceramics
Čtvrtlík, Radim ; Kulykovskyy, Valeriy ; Vorlíček, Vladimír ; Boháč, Petr ; Stranyánek, Martin
Mechanical properties of hard amorphous and nanocrystalline films with dominant covalent bonds are nowadays the subject of enhanced interest. Such films can be harder than corresponding bulk material due to peculiarities of structure and numerous growth defects.
Photo-Electrochemical Properties of Hierarchical Nanocomposite Structure: Carbon Nanofibers/TiO2/ZnO Thin Films
Hubička, Zdeněk ; Kment, Štěpán ; Gregora, Ivan ; Čada, Martin ; Olejníček, Jiří ; Klusoň, Petr ; Petras, D. ; Krýsa, J. ; Jastrabík, Lubomír ; Dytrych, Pavel
In this contribution we report on photoelectrochemical functionality of the multilayers system consisting of CNF's/photoactive anatase TiO2/ conductive ZnO thin films. Recently the thin phthalocyanines films has been prepared and studied individually.
Measurement of scattering properties of ultrathin glass mirrors
Mandát, Dušan ; Pech, Miroslav ; Palatka, Miroslav ; Nožka, Libor ; Nováková, P. ; Hrabovský, M. ; Schovánek, Petr
Following text deals with results of light scattering measurement of glass mirrors using the optical instrument CASI owned by Joint Lab- oratory of Optics (JLO) of the Palacky University and the Institute of Physics of Academy of Science of the Czech Republic. JLO pro- duces the large-area ultrathin mirros which are used in fluorescence detectores (FD).
Near UV filter optical properties
Palatka, Miroslav ; Mandát, Dušan ; Pech, Miroslav ; Nožka, Libor ; Nováková, P. ; Marek, M. ; Hrabovský, M. ; Schovánek, Petr
Following text notice results of measurement of optical properties of the M-UG6 filter used in fluorescence telescopes (FD). We use op- tical instruments owned by Joint Laboratory of Optics of the Palacky University and the Institute of Physics of Academy of Science of the Czech Republic.
Silicon monocrystal wafers ground with various abrasive materials
Havelková, Martina ; Hiklová, Helena
The paper describes measuring of silicon wafers surface. Row of samples were made for different purposes in Themis (Rožnov pod Radhoštěm). The measuring were done with Form Talysurf Series 2 apparatus and the dependence on different conditions of cutting and grinding were monitored.
2D and 3D mapping of solid surfaces using Form Talysurf Series 2 device
Hiklová, Helena
Report deals briefly advantages and disadvantages of contact surface mapping. Despite of some disadvantages this way of exploring has its irreplaceable position in technical practice and research respectively.
Contact system of solid state surface mapping
Hiklová, Helena ; Havelková, Martina ; Chmelíčková, Hana ; Lapšanská, Hana
The advantages of contact solid state surface mapping are reminded in this paper. Some possibilities are demonstrated by several examples. These examples include measuring of laser beam treated silicon surface and mapping of laser cuts in metal sheets.
Optical methods in non-contact velocity measurement
Šmíd, Petr
The paper presents an overview of some interesting methods using optical and sound waves for non-contact velocity measurements. The paper focuses mainly on optical techniques using different optical principles as interferometry, image analysis and processing, and speckle effect.
Optical sensor for measurement of an object In-plane translation and rotation by speckle correlation method
Horváth, P. ; Šmíd, Petr ; Hrabovský, M. ; Hamarová, I.
The paper presents design and experimental verification of an optical sensor for non-contact detection and quantitative evaluations of both in-plane translation and rotation of object’s surface by speckle correlation method. This sensor enables to detect both of the small deformation tensor components without change in geometrical parameters of the set-up and hence its conversion.
Depozice tenkých vrstev Ba.sub.x./sub.Sr.sub.1-x./sub.TiO.sub.3./sub. pomocí dvoutryskového RF plazmatického systému s efektem duté katody
Hubička, Zdeněk ; Virostko, Petr ; Olejníček, Jiří ; Deyneka, Alexander ; Adámek, Petr ; Valvoda, V. ; Jastrabík, Lubomír ; Šícha, Miloš ; Tichý, M.
Low-pressure plasma jet system with two hollow cathodes was used for deposition of BaxSr1-xTiO3 (BSTO) ferroelectric thin films. High density pulse modulated RF hollow cathode discharge was generated in ceramic nozzles made of SrTiO3 and BaTiO3. In the experiment, the composition of BSTO films was controlled by magnitude of average RF power applied on particular plasma jet guns. X-ray diffraction proved that BSTO thin films were polycrystalline with perovskite structure. Time resolved Langmuir probe system and plasma impedance monitor were used for ´in situ´ plasma diagnostics and control of deposition conditions.

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