Original title: Contact system of solid state surface mapping
Authors: Hiklová, Helena ; Havelková, Martina ; Chmelíčková, Hana ; Lapšanská, Hana
Document type: Papers
Conference/Event: International Scientific Conference Experimental Stress Analysis 2010 /48./, Velké Losiny (CZ), 2010-05-31 / 2010-06-03
Year: 2010
Language: eng
Abstract: The advantages of contact solid state surface mapping are reminded in this paper. Some possibilities are demonstrated by several examples. These examples include measuring of laser beam treated silicon surface and mapping of laser cuts in metal sheets.
Keywords: 3D imaging of solid surfaces; contact profilometer; contact sensing
Project no.: CEZ:AV0Z10100522 (CEP), KAN301370701 (CEP), 1M06002 (CEP)
Funding provider: GA AV ČR, GA MŠk
Host item entry: Experimental Stress Analysis 2010, ISBN 978-80-244-2533-7
Note: Související webová stránka: http://ean2010.upol.cz/site_cs/

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0194899

Permalink: http://www.nusl.cz/ntk/nusl-42523


The record appears in these collections:
Research > Institutes ASCR > Institute of Physics
Conference materials > Papers