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An influence of electron beam on thin oxide films
Kostyal, Michal ; Průša, Stanislav (referee) ; Čechal, Jan (advisor)
This bachelor work deals with a study of the influence of electron beam of scanning electron microscope on the surface of the SiO2/Si (100) – sample. In the work the electron and atomic force microscopy briefly described. The main objective of experimental part is to describe variation in the brightness of sample SiO2/Si (100) in Scanning electron microscope images. In this study is found that on the sample surface are created objects few nm high. The rest of the work is then devoted to measuring the dependence of the object’s high on different variables. Experiments are generally based on the selective irradiation of the sample surface by scanning electron microscope, measurement of irradiated parts using atomic force microscope and evaluation in the application Gwyddion.
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Properties of cement composites with fiber reinforcement
Jankech, Filip ; Sitek,, Libor (referee) ; Bodnárová, Lenka (advisor)
This thesis summarizes the knowledge of the possibility of using organic fibres as dispersed reinforcement into cement composites. It is concretely a summary of knowledge about the types and properties of synthetic and cellulosic fibres, their influence on the properties of fresh and hardened cement composite and lastly a description of the fire resistance of cement composites and the effect of organic fibres on the action of those composites at high temperatures and in the presence of fire. The experimental part is supposed to verify the effect of the cellulose fibres on increasing the durability of the cement composite at high temperatures.
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The possibilities of using nanoparticles of various metals as the markers for immunocytochemical labelling in field emission scanning electron microscopy
EIBLOVÁ, Veronika
Nowadays, electron microscopy is a widespread method used in many biological branches like medicine, physical science, mikrobiology or material technology. Scanning electron microscope is a type of an electron microscope that shows the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The signal of electrons reveals information about the sample such as morphology, chemical composition and structure and materials. Gold nanoparticles are widely used as a marker for immunolabeling in these days. The main point of this research was to find other nanoparticles, which can be used for multiple immunolabeling. The main task of this study is to conjugate these particles with atibodies, to use them for immunolocalisation on the convenient biological sample and to observe it in FESEM JEOL JSM-7401F.
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Kinetika doznívání scintilačních krystalů pro detektory elektronů v SEM
Schauer, Petr
A study of the decay kinetics of YAG:Ce single crystal scintillators for SEM is presented in this paper. The principal quantities of image quality in SEM are contrast, spatial resolution, and noise. However, to quantify the overall performance of an imaging system, the detective quantum efficiency (DQE) is a better tool as it includes both the modulation transfer function and the noise power spectrum. This means that for a detector to have high DQE, it should possess not only high efficiency and low noise, but also good kinetic properties. Utilizing of the cathodoluminescence decay results, a schematic kinetic model of radiative and nonradiative transitions in the YAG:Ce single crystals is presented.
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X-ray microanalysis in ESEM and LV SEM
Autrata, Rudolf ; Jirák, Josef ; Špinka, Jiří
The scattering of primary electrons to so-called skirt, appearing in the range of pressures used in regimes of LV SEM (low vacuum) as well as in ESEM, has no substantial influence on the spatial resolution for commonly used types of imaging in the scanning electron microscope. It demonstrates itself just as a higher share of the noise signal. What is more, it brings known substantial advantages, as that no preparation of modification of non-conductive samples is needed and observation of liquid phase containing specimens is made possible.
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The first experience with a low voltage electron microscope
Nebesářová, Jana
The low voltage electron microscope LV EM 5 manufactured by Delong Instruments is described and methods of preparation of biological specimens for the observation in this microscope are briefly evaluated. LV EM 5 is a unique apparatus that could replace in medical and biological research laboratories high volatage transmission electron microscopes.
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