National Repository of Grey Literature 7 records found  Search took 0.01 seconds. 
Entomopathogenic fungus \kur{Beauveria bassiana }- biological characteristics
PAVLÍČEK, Pavel
This literature compilation focuses on current knowledge in the biological characteristics of the entomopathogenic fungi Beauveria bassiana, with emphasis on the influence of abiotic factors on the development and its effectiveness in selected species of harmful insects. Knowledge of abiotic factors is important for a successful outcome to protect plants against harmful agents this entomopathogen. There are also set out the specifics, benefits and examples of using the aforementioned entomopathogen in biological plant protection. In conclusion, the possibilities are assessed using the entomopathogenic fungi B. bassiana in plant protection in the Czech Republic and other aspects concerning the practical use and distribution.
Laserové zpracování z křemíku
Chmelíčková, Hana ; Lapšanská, Hana ; Hiklová, Helena ; Havelková, Martina ; Pavlíček, Pavel
Laser technologies in silicon treatment were introduced in article possibilities to break silicon wafers by means of Nd:YAG laser in university laboratory were examined.
Meření tvaru křemíkových desek pomocí interferometrie v bílém světle
Pavlíček, Pavel ; Chmelíčková, Hana
The form of silicon wafer is measured by white-light interferometry with measurement uncertainty about 1 μm. In this way waviness or deviations of the silicon wafers can be measured.
Height profile measurement by means of white-light interferometry
Pavlíček, Pavel
White-light interferometer measures the heigh profile of smooth as well of rough surfaces, this feature renders it suitable for the technical practice.
Height profile measurement by means of white-light interferometry
Pavlíček, Pavel
White-light interferometry is an established method for the height-profile measurement of rough surface. we show the results of the heigh-profile measurement of silicon waters.
Profilometry by means of white light interference
Pavlíček, Pavel
Profilometry by means of white-light interference is a suitable method for measurement of topology of rough surfaces. This contactless optical method measures the height profile with an uncertainly of about 1ćm.

See also: similar author names
6 PAVLÍČEK, Pavel
8 PAVLÍČEK, Petr
8 Pavlíček, Petr
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