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Original title:
Height profile measurement by means of white-light interferometry
Authors:
Pavlíček, Pavel
Document type:
Papers
Conference/Event:
National Conference with International Participation "Engineering Mechanics 2003"
, Svratka (CZ), 2003-05-12 / 2003-05-15
Year:
2003
Language:
eng
Abstract:
White-light interferometer measures the heigh profile of smooth as well of rough surfaces, this feature renders it suitable for the technical practice.
Keywords:
rough surface -height profile
;
white-light interferometry
Project no.:
CEZ:AV0Z1010921
(
CEP
),
LN00A015
(
CEP
)
Funding provider:
GA MŠk
Host item entry:
Engineeting Mechanics 2003
Institution:
Institute of Physics AS ČR (
web
)
Document availability information:
Fulltext is available at the institute of the Academy of Sciences.
Original record:
http://hdl.handle.net/11104/0032356
Permalink:
http://www.nusl.cz/ntk/nusl-21895
The record appears in these collections:
Research
>
Institutes ASCR
>
Institute of Physics
Conference materials
>
Papers
Record created 2011-07-01, last modified 2024-01-26
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