|
|
Determining the measurement accuracy of a coordinate measuring machine Zeiss UPMC Carat
Kiška, Roman ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The aim of this diploma thesis is to create a comprehensive study of measurement accuracy of coordinate measuring machine (hereinafter CMM) Zeiss UPMC 850 Carat S-ACC (hereinafter Zeiss Carat) for the needs of the national metrological institute in Brno in accordance with ČSN EN ISO / IEC 17025 and the follow-up system standards of the ČSN EN ISO 10360 series. Additionally, it includes the creation of instructions for the calculation of measurement uncertainty, which will be put into effect in an accredited calibration laboratory. The first part of the work focuses on the description of the current state of knowledge and the definition of basic concepts in the field of metrology and accurate measurements on CMM. The second part describes the Zeiss Carat measuring machine, identifies the individual contributors to the resulting measurement uncertainty and defines the methodology for their quantification. The last part deals with the evaluation of calibration data and the calculation of the expanded measurement uncertainty of the Zeiss Carat instrument, which is used to quantify its accuracy.
|
|
|
Techniques of thin layers deposition and characterization, their analysis using scanning electron microscopy
Kiška, Roman ; Moravčík, Igor (referee) ; Čupera, Jan (advisor)
My thesis is concerned with the application of thin films methods and it focuses on the method of PVD and CVD. Another part of my work is experimental, where two samples were preapared by magnetron sputtering and by method of gas phase deposition. The aim of the work was to compare their material properties with commercially produced samples. Severel parts were measured - nanohardness, adhesion, roughness and thickness. Theoretical part focuses on chemical and physical essence of the different methods of the deposition of thin films and on the description of material properties, that are essential for thin films. The practical part includes the description of depositional processes and of the characteristic techniques used in the practical part.
|
|
|
Determining the measurement accuracy of a coordinate measuring machine Zeiss UPMC Carat
Kiška, Roman ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The aim of this diploma thesis is to create a comprehensive study of measurement accuracy of coordinate measuring machine (hereinafter CMM) Zeiss UPMC 850 Carat S-ACC (hereinafter Zeiss Carat) for the needs of the national metrological institute in Brno in accordance with ČSN EN ISO / IEC 17025 and the follow-up system standards of the ČSN EN ISO 10360 series. Additionally, it includes the creation of instructions for the calculation of measurement uncertainty, which will be put into effect in an accredited calibration laboratory. The first part of the work focuses on the description of the current state of knowledge and the definition of basic concepts in the field of metrology and accurate measurements on CMM. The second part describes the Zeiss Carat measuring machine, identifies the individual contributors to the resulting measurement uncertainty and defines the methodology for their quantification. The last part deals with the evaluation of calibration data and the calculation of the expanded measurement uncertainty of the Zeiss Carat instrument, which is used to quantify its accuracy.
|
|
|
Techniques of thin layers deposition and characterization, their analysis using scanning electron microscopy
Kiška, Roman ; Moravčík, Igor (referee) ; Čupera, Jan (advisor)
My thesis is concerned with the application of thin films methods and it focuses on the method of PVD and CVD. Another part of my work is experimental, where two samples were preapared by magnetron sputtering and by method of gas phase deposition. The aim of the work was to compare their material properties with commercially produced samples. Severel parts were measured - nanohardness, adhesion, roughness and thickness. Theoretical part focuses on chemical and physical essence of the different methods of the deposition of thin films and on the description of material properties, that are essential for thin films. The practical part includes the description of depositional processes and of the characteristic techniques used in the practical part.
|
guest ::
