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Active Angular Alignment of Gauge Blocks in Double-Ended Interferometers
Buchta, Zdeněk
This paper presents a method implemented in a system for automatic contactless calibration of gauge blocks designed at ISI ASCR. The system combines low-coherence interferometry and laser interferometry, where the first identifies the gauge block sides position and the second one measures the gauge block length itself. A crucial part of the system is the algorithm for gauge block alignment to the measuring beam which is able to compensate the gauge block lateral and longitudinal tilt up to 0.141 mrad. The algorithm is also important for the gauge block position monitoring during its length measurement.
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Nanometrology coordinate measurement machines uncertainties caused by frequency fluctuations of the laser
Hrabina, Jan ; Lazar, Josef ; Číp, Ondřej
One of considerable sources of displacement measurement uncertainty in nanometrology systems such as multidimensional interferometric positioning for local probe microscopy is the influence of amplitude and especially frequency noise of a laser source which powers the interferometers. We investigated the noise properties of several laser sources suitable for interferometry for micro- and nano-CMMs (coordinate measurement machines) and compared the results with the aim to find the best option. The influences of amplitude and frequency fluctuations were compared together with the noise and uncertainty contributions of other components of the whole measuring system. Frequency noise of investigated laser sources was measured by two approaches – at first with the help of frequency discriminator (Fabry-Perot resonator) converting the frequency (phase) noise into amplitude one and then directly through the measurement of displacement noise at the output of the interferometer fringe detection and position evaluation. Both frequency noise measurements and amplitude noise measurements were done simultaneously through fast and high dynamic range synchronous sampling to have the possibility to separate the frequency noise and to compare the recorded results.
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Displacement Interferometry in Passive Fabry-Perot Cavity
Lazar, Josef ; Číp, Ondřej ; Oulehla, Jindřich ; Pokorný, Pavel ; Fejfar, Antonín ; Stuchlík, Jiří
We present techniques oriented to improvement of precision in incremental interferometric measurements of displacements over a limited range where the atmospheric wavelength of the coherent laser source is either directly stabilized to a mechanical reference or is corrected to fit to the reference. This may represent a reduction of uncertainty linking the laser wavelength not to indirectly evaluated refractive index but to the setup mechanics which cannot be completely eliminated. Here we suggest an approach where the traditional interferometers are replaced by a passive Fabry-Perot cavity with position sensing using an intracavity transparent photodetector.
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Multiple Probe Photonic Force Microscopy
Jákl, Petr ; Šerý, Mojmír ; Zemánek, Pavel
Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance.
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Interference coatings on laser amplifiers
Oulehla, Jindřich
This contribution deals with the technology used for designing and producing interference coatings on materials used for manufacturing laser amplifiers. These coatings must not only meet the optical performance requirements but also others. For example they must be able to withstand cryogenic cooling, high laser beam fluence, etc.
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Generation of exact lengths by the use of optical comb
Šmíd, Radek
We present a method genaration of precise length using optical frequency comb stabilized to atomic reference clock. Optical frequency comb are able to tranfer the exact time stability from atomic clock reference to optical path measurement. We used Fabry-Perot cavity with ultra-low expansion material placed into the vacuum chamber. The exact length of Fabry-Perot cavity in vacuum is used as a reference for measurement of refractive index of ambient air.
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Laser interferometry with optical fibers and fiber Bragg gratings
Mikel, Břetislav
Optical fibers and fiber Bragg grating can improve using of standard laser interferometry methods in industry applications. Especially fiber Bragg gratings can improve frequency parameters of laser diodes in the laser interferometers. These parameters increase resolution and measurement range of the laser interferometer.
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