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Influence of working conditions on the results of EDS in ESEM
Pospíchal, David ; Čech, Ondřej (referee) ; Čudek, Pavel (advisor)
The bachelor thesis deals with energy dispersion spectroscopy and detection of characteristic X-rays in the field of environmental scanning electron microscope. The aim of the semester work is to compare the results of elemental microanalysis of samples under optimal conditions and to monitor changes of results, when changing working conditions, resp. nitrogen and water vapor pressure in the sample chamber of the scanning electron microscope Vega3 XMU with LaB6 cathode. TESCAN, a.s equipped with Xflash 6 | 10 spectrophotometer. Bruker
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Analysis of active material for batteries by EDS
Vídeňský, Ondřej ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This master thesis deals with analysis of battery mass using x-ray spectral microanalysis. For the measurement two scanning electron microscopes equipped with energy dispersive x-ray spectroscopes were used. Appropriate examples were prepaired by standard method. Then elemental analysis was performed with changing conditions of measurement. Two programs were used for spectrums evaluation and in the end the size of errors was observed for every conditions.
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Optimization of UHV SEM for nanostructure study in wide temperature range
Axman, Tomáš ; Zigo,, Juraj (referee) ; Bábor, Petr (advisor)
This diploma thesis deals with the optimization of ultra-high vacuum scanning electron microscope - UHV SEM, which is developed within the Amispec project in cooperation with BUT, Institute of Scientific Instruments of the Czech Academy of Science and Tescan Brno, s.r.o. The theoretical part deals with the description of the actual state of the developed equipment and the research of competing systems. The next part describes the optimization of the sample holder and the pallet receptor for studying nanostructures over a wide range of temperatures. Part of the optimization is the sapphire thermal diode development and experimental verification of the functionality of the designed components. This is followed by the verification of the functionality of the whole system for the transport of samples to the UHV area, deposition with effusion cell and in-situ observations.
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Optimization of scintillation detector for detection of low energy signal electrons in electron microscopy
Tihlaříková, Eva ; Kadlec, Jaromír (referee) ; Uruba, Václav (referee) ; Neděla, Vilém (advisor)
The dissertation thesis deals with optimization of the scintillation detector for efficient detection of low energy signal electrons in a specimen chamber of a scanning electron microscope. The solution was based on the study of signal electron energy loss mechanisms during their interaction with a conductive layer and a scintillator that can be studied using simulations based on the stochastics Monte Carlo methods. Based on test simulations and their comparison with experimental data, the ideal Monte Carlo software was chosen and used for the study of signal electron energy losses during their transport through the conductive layer as well as following interaction with scintillator, in dependency on the signal electron energy. Simulation results allowed to define criteria for the optimization of the conductive layer. According to these parameters, the optimized layers were deposited on the surface of different scintillators and experimentally tested in the scintillation detector of the scanning electron microscope. Experimental measurements allowed to verify accomplished simulations and provide new information about impact of materials and thicknesses of conductive layers in combination with materials of scintillators and light guides. The increase of the detection efficiency of the scintillation detector equipped with optimised conductive layers and its capability to detect low energy signal electrons were experimentally proved.
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Diagnostic of semiconductor materials by EBIC method
Davidová, Lenka ; Máca, Josef (referee) ; Čudek, Pavel (advisor)
Master´s thesis is focused on diagnostics of semiconductor materials by EBIC method (measuring of currents induced beam), determination of the lifetime of minority carriers, or their diffusion length. The theoretical part is aimed at the principle of scanning electron microscopy, the characteristic properties of the microscope and the signals generated by the interaction of the primary electron beam with the sample. The thesis describes a structure of semiconducting silicon, band models, types of lattice defects and doped of semiconductor structures. After that it is described the theory of calculation of the diffusion length of minority carriers in semiconductors of type N and P. The aim of the experiment part of the thesis is to measure the properties of the semiconductor structure by EBIC and determination of diffusion length and lifetime of minority charge carriers based on the measured data The aim of the experiment part of the thesis is to measure the properties of the semiconductor structure by EBIC and determination of diffusion length and lifetime of minority charge carriers on the basis of the measured data.
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Influence of working conditions on results of EDS analysis in environmental SEM
Kaplenko, Oleksii ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
The bachelor thesis contains an operating principle of the environmental scanning electron microscope (ESEM), issue of detection of characteristic X-Ray by using an energy dispersive spectroscopy method. The work describes detection of X-rays through silicon drifted detector, and also the principle of qualitative and quantitative X-ray microanalysis. The aim of this work is to study the influence of working conditions in the scanning electron microscope VEGA3 XMU equipped with Xflash 6 | 10 spectroscope on the results of X-ray microanalysis and their evaluations.
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Influence of working conditions on the signal level detected by LVSTD detector
Tylich, Ondřej ; Zimáková, Jana (referee) ; Čudek, Pavel (advisor)
This bachelor project includes information about function of low vacuum scanning electron microscope and describes it’s parts. It explains the difference between low vacuum and high vacuum scannig electron microscope. Contains informations about creation and detection of secondary electrons using scintillation detectors. It describes the calculation of signal to noise ratio and the method for obtaining the values of signal. Project is focused to determine the value of signal with a change in working conditions obtained by using Low Vacuum Secondary Electron Detector TESCAN (LVSTD). The aim is to determine the stability of the effect of working conditions on LVSTD.
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Influence of working conditions on the signal level detected by BSE detector
Bednář, Eduard ; Zimáková, Jana (referee) ; Čudek, Pavel (advisor)
This thesis deals with the evaluation of the quality of the signal level of backscattered electrons detected by the scintillation backscattered electron detector depending on the working conditions in low vacuum scanning electron microscope. The theoretical part describes the issue of environmental scanning electron microscopy, the principle of generation the signal and detection of backscattered electrons. The experimental part of the thesis is to measure the properties of the scintillation detector of backscattered electrons. A series of experiments is evaluated the influence of working conditions on the stability and function of the detector of backscattered electron.
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