Original title: Diagnostika polovodičových materiálů metodou EBIC
Translated title: Diagnostic of semiconductor materials by EBIC method
Authors: Kuznetsov, Vitalii ; Vaněk, Jiří (referee) ; Čudek, Pavel (advisor)
Document type: Bachelor's theses
Year: 2024
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Abstract: [cze] [eng]

Keywords: carrier lifetimes; diffusion length.; electron beam inducted current; interaction of PE with solid; Scanning electron microscope; semiconductors; difuzní délka nosičů.; doba života nosičů; interakce PE s pevnou látkou; měření proudu indukovaného svazkem; polovodiče; Rastrovací elektronový mikroskop

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: https://hdl.handle.net/11012/246875

Permalink: http://www.nusl.cz/ntk/nusl-619764


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2024-06-22, last modified 2024-06-22


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